Dissipative behavior due to flux motion in ultrathin YBaCuO films

H. H. Sung; H. C. Yang; T. R. Yang; B. C. Yao; H. E. Horng

doi:10.1016/0921-4534(91)91236-W

Dissipative behavior due to flux motion in ultrathin YBaCuO films

H. H. Sung^*, H. C. Yang, T. R. Yang, B. C. Yao, H. E. Horng

^*此作品的通信作者

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

3 引文斯高帕斯（Scopus）

摘要

The resistive transition of ultrathin YBCO films in a field has been measured to study the dissipative behavior due to flux motion. The thickness of the films is in the order of 30 - 40 nm. The broadening of the resistive transition is compared with that of thick films. The results are discussed in the framework of the flux creep theory.

原文	英語
頁（從 - 到）	2223-2224
頁數	2
期刊	Physica C: Superconductivity and its applications
卷	185-189
發行號	PART 4
DOIs	https://doi.org/10.1016/0921-4534(91)91236-W
出版狀態	已發佈 - 1991 12月 1

ASJC Scopus subject areas

電子、光磁材料
凝聚態物理學
能源工程與電力技術
電氣與電子工程

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10.1016/0921-4534(91)91236-W

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abstract = "The resistive transition of ultrathin YBCO films in a field has been measured to study the dissipative behavior due to flux motion. The thickness of the films is in the order of 30 - 40 nm. The broadening of the resistive transition is compared with that of thick films. The results are discussed in the framework of the flux creep theory.",

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AU - Horng, H. E.

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AB - The resistive transition of ultrathin YBCO films in a field has been measured to study the dissipative behavior due to flux motion. The thickness of the films is in the order of 30 - 40 nm. The broadening of the resistive transition is compared with that of thick films. The results are discussed in the framework of the flux creep theory.

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Dissipative behavior due to flux motion in ultrathin YBaCuO films

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