Dielectric properties of Bi2(Zn1/3Nb2/3)2O7 thin films measured by fourier transform infrared spectroscopy

Yi Chun Chen, Hsiang Lin Liu, Hsiu Fung Cheng*, I. Nan Lin

*此作品的通信作者

研究成果: 雜誌貢獻期刊論文同行評審

6 引文 斯高帕斯(Scopus)

摘要

We report the far infrared measurement for comparing the dielectric properties of properties to the microwave frequency region for the thin films (ε1)film =20 is markedly smaller than those for bulk ceramics. The frequency response, measured by Fourier transform infrared spectroscopy (FTIR), reveals that the phonon peaks of BiZN thin films occur at higher frequencies and have smaller amplitudes, as compared to those of BiZN bulk. This phenomenon implies that the smaller dielectric constant for BiZN thin films is due to the strain induced in the thin films.

原文英語
頁(從 - 到)1711-1714
頁數4
期刊Journal of the European Ceramic Society
21
發行號10-11
DOIs
出版狀態已發佈 - 2001

ASJC Scopus subject areas

  • 陶瓷和複合材料
  • 材料化學

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