Dielectric properties of Bi2(Zn1/3Nb2/3)2O7 thin films measured by fourier transform infrared spectroscopy

Yi Chun Chen, Hsiang Lin Liu, Hsiu Fung Cheng, I. Nan Lin

研究成果: 雜誌貢獻文章同行評審

6 引文 斯高帕斯(Scopus)


We report the far infrared measurement for comparing the dielectric properties of properties to the microwave frequency region for the thin films (ε1)film =20 is markedly smaller than those for bulk ceramics. The frequency response, measured by Fourier transform infrared spectroscopy (FTIR), reveals that the phonon peaks of BiZN thin films occur at higher frequencies and have smaller amplitudes, as compared to those of BiZN bulk. This phenomenon implies that the smaller dielectric constant for BiZN thin films is due to the strain induced in the thin films.

頁(從 - 到)1711-1714
期刊Journal of the European Ceramic Society
出版狀態已發佈 - 2001 八月 31

ASJC Scopus subject areas

  • Ceramics and Composites
  • Materials Chemistry

指紋 深入研究「Dielectric properties of Bi<sub>2</sub>(Zn<sub>1/3</sub>Nb<sub>2/3</sub>)<sub>2</sub>O<sub>7</sub> thin films measured by fourier transform infrared spectroscopy」主題。共同形成了獨特的指紋。