摘要
This paper presents a novel approach to narrow, deep slot-wall measurement in micromolds. A tabletop hybrid measurement-center combining micro spark erosion and automatic optical inspection technique (AOI) with Capacitive Sensing (CS) technology is developed for measuring the perpendicularity of slot-walls in the very narrow and deep slots of precision molds. A microprobe is machined in-situ using micro wire spark erosion while the AOI system acquires images to help fast position the completed microprobe precisely over the narrow slot to be measured. Capacitive sensing with a high-frequency, low-voltage electric signal is employed between the probe and slot-wall to precisely sense the perpendicularity of the wall. A four-step probe feed approach is utilized to improve measurement accuracy. The technical feasibility of capacitive sensing technology is experimentally confirmed.
| 原文 | 英語 |
|---|---|
| 頁(從 - 到) | 216-222 |
| 頁數 | 7 |
| 期刊 | Microelectronics Reliability |
| 卷 | 83 |
| DOIs | |
| 出版狀態 | 已發佈 - 2018 4月 |
ASJC Scopus subject areas
- 電子、光磁材料
- 原子與分子物理與光學
- 安全、風險、可靠性和品質
- 凝聚態物理學
- 表面、塗料和薄膜
- 電氣與電子工程
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