TY - JOUR
T1 - Development of a capacitive sensing technology for the measurement of perpendicularity in the narrow, deep slot-walls of micromolds
AU - Chen, Shun Tong
AU - Lin, Sheng min
N1 - Publisher Copyright:
© 2017 Elsevier Ltd
PY - 2018/4
Y1 - 2018/4
N2 - This paper presents a novel approach to narrow, deep slot-wall measurement in micromolds. A tabletop hybrid measurement-center combining micro spark erosion and automatic optical inspection technique (AOI) with Capacitive Sensing (CS) technology is developed for measuring the perpendicularity of slot-walls in the very narrow and deep slots of precision molds. A microprobe is machined in-situ using micro wire spark erosion while the AOI system acquires images to help fast position the completed microprobe precisely over the narrow slot to be measured. Capacitive sensing with a high-frequency, low-voltage electric signal is employed between the probe and slot-wall to precisely sense the perpendicularity of the wall. A four-step probe feed approach is utilized to improve measurement accuracy. The technical feasibility of capacitive sensing technology is experimentally confirmed.
AB - This paper presents a novel approach to narrow, deep slot-wall measurement in micromolds. A tabletop hybrid measurement-center combining micro spark erosion and automatic optical inspection technique (AOI) with Capacitive Sensing (CS) technology is developed for measuring the perpendicularity of slot-walls in the very narrow and deep slots of precision molds. A microprobe is machined in-situ using micro wire spark erosion while the AOI system acquires images to help fast position the completed microprobe precisely over the narrow slot to be measured. Capacitive sensing with a high-frequency, low-voltage electric signal is employed between the probe and slot-wall to precisely sense the perpendicularity of the wall. A four-step probe feed approach is utilized to improve measurement accuracy. The technical feasibility of capacitive sensing technology is experimentally confirmed.
KW - Automatic optical inspection-assisted technique
KW - Capacitive sensing technology
KW - Hybrid measurement-center
KW - Narrow deep slot-wall
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U2 - 10.1016/j.microrel.2017.03.029
DO - 10.1016/j.microrel.2017.03.029
M3 - Article
AN - SCOPUS:85016614423
SN - 0026-2714
VL - 83
SP - 216
EP - 222
JO - Microelectronics Reliability
JF - Microelectronics Reliability
ER -