摘要
To effectively protect the millimeter-wave (MMW) circuits in nanoscale CMOS technology from electrostatic discharge (ESD) damages, a dual-band ESD protection cell for 24-/60-GHz ESD protection is presented in this paper. The proposed ESD protection cell consisted of a diode, a silicon-controlled rectifier, a PMOS, and two inductors. To verify the dual-band characteristics and ESD robustness, the proposed ESD protection circuit had been applied to a 24-/60-GHz low-noise amplifier (LNA). The measurement results showed over-2-kV human-body-model ESD robustness with little performance degradation on LNA. The proposed dual-band ESD protection cell was suitable for circuit designers for them to easily apply ESD protection in the dual-band MMW circuits.
| 原文 | 英語 |
|---|---|
| 文章編號 | 6296697 |
| 頁(從 - 到) | 110-118 |
| 頁數 | 9 |
| 期刊 | IEEE Transactions on Device and Materials Reliability |
| 卷 | 13 |
| 發行號 | 1 |
| DOIs | |
| 出版狀態 | 已發佈 - 2013 |
| 對外發佈 | 是 |
ASJC Scopus subject areas
- 電子、光磁材料
- 安全、風險、可靠性和品質
- 電氣與電子工程
指紋
深入研究「Design of dual-band ESD protection for 24-/60-GHz millimeter-wave circuits」主題。共同形成了獨特的指紋。引用此
- APA
- Standard
- Harvard
- Vancouver
- Author
- BIBTEX
- RIS