TY - JOUR
T1 - Design of dual-band ESD protection for 24-/60-GHz millimeter-wave circuits
AU - Chu, Li Wei
AU - Lin, Chun Yu
AU - Ker, Ming Dou
PY - 2013
Y1 - 2013
N2 - To effectively protect the millimeter-wave (MMW) circuits in nanoscale CMOS technology from electrostatic discharge (ESD) damages, a dual-band ESD protection cell for 24-/60-GHz ESD protection is presented in this paper. The proposed ESD protection cell consisted of a diode, a silicon-controlled rectifier, a PMOS, and two inductors. To verify the dual-band characteristics and ESD robustness, the proposed ESD protection circuit had been applied to a 24-/60-GHz low-noise amplifier (LNA). The measurement results showed over-2-kV human-body-model ESD robustness with little performance degradation on LNA. The proposed dual-band ESD protection cell was suitable for circuit designers for them to easily apply ESD protection in the dual-band MMW circuits.
AB - To effectively protect the millimeter-wave (MMW) circuits in nanoscale CMOS technology from electrostatic discharge (ESD) damages, a dual-band ESD protection cell for 24-/60-GHz ESD protection is presented in this paper. The proposed ESD protection cell consisted of a diode, a silicon-controlled rectifier, a PMOS, and two inductors. To verify the dual-band characteristics and ESD robustness, the proposed ESD protection circuit had been applied to a 24-/60-GHz low-noise amplifier (LNA). The measurement results showed over-2-kV human-body-model ESD robustness with little performance degradation on LNA. The proposed dual-band ESD protection cell was suitable for circuit designers for them to easily apply ESD protection in the dual-band MMW circuits.
KW - CMOS
KW - dual-band
KW - electrostatic discharge (ESD) protection
KW - millimeter-wave (MMW)
KW - radio frequency (RF)
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U2 - 10.1109/TDMR.2012.2217498
DO - 10.1109/TDMR.2012.2217498
M3 - Article
AN - SCOPUS:84874973588
SN - 1530-4388
VL - 13
SP - 110
EP - 118
JO - IEEE Transactions on Device and Materials Reliability
JF - IEEE Transactions on Device and Materials Reliability
IS - 1
M1 - 6296697
ER -