跳至主導覽 跳至搜尋 跳過主要內容

Design and implementation of configurable ESD protection cell for 60-GHz RF circuits in a 65-nm CMOS process

  • Chun Yu Lin*
  • , Li Wei Chu
  • , Ming Dou Ker
  • *此作品的通信作者

研究成果: 雜誌貢獻期刊論文同行評審

10   !!Link opens in a new tab 引文 斯高帕斯(Scopus)

摘要

The configurable electrostatic discharge (ESD) protection cells have been implemented in a commercial 65-nm CMOS process for 60-GHz RF applications. The distributed ESD protection scheme was modified to be used in this work. With the consideration of parasitic capacitance from I/O pad, the ESD protection cells have reached the 50-Ω input/output matching to reduce the design complexity for RF circuit designer and to provide suitable ESD protection. Experimental results of these ESD protection cells have successfully verified the ESD robustness and the RF characteristics in the 60-GHz frequency band. These ESD protection cells can easily be used for ESD protection design in the 60-GHz RF applications, and accelerate the design cycle.

原文英語
頁(從 - 到)1315-1324
頁數10
期刊Microelectronics Reliability
51
發行號8
DOIs
出版狀態已發佈 - 2011 8月
對外發佈

ASJC Scopus subject areas

  • 電子、光磁材料
  • 原子與分子物理與光學
  • 凝聚態物理學
  • 安全、風險、可靠性和品質
  • 表面、塗料和薄膜
  • 電氣與電子工程

指紋

深入研究「Design and implementation of configurable ESD protection cell for 60-GHz RF circuits in a 65-nm CMOS process」主題。共同形成了獨特的指紋。

引用此