Design and implementation of configurable ESD protection cell for 60-GHz RF circuits in a 65-nm CMOS process

Chun Yu Lin, Li Wei Chu, Ming Dou Ker

研究成果: 雜誌貢獻文章

8 引文 斯高帕斯(Scopus)

摘要

The configurable electrostatic discharge (ESD) protection cells have been implemented in a commercial 65-nm CMOS process for 60-GHz RF applications. The distributed ESD protection scheme was modified to be used in this work. With the consideration of parasitic capacitance from I/O pad, the ESD protection cells have reached the 50-Ω input/output matching to reduce the design complexity for RF circuit designer and to provide suitable ESD protection. Experimental results of these ESD protection cells have successfully verified the ESD robustness and the RF characteristics in the 60-GHz frequency band. These ESD protection cells can easily be used for ESD protection design in the 60-GHz RF applications, and accelerate the design cycle.

原文英語
頁(從 - 到)1315-1324
頁數10
期刊Microelectronics Reliability
51
發行號8
DOIs
出版狀態已發佈 - 2011 八月 1

    指紋

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Safety, Risk, Reliability and Quality
  • Condensed Matter Physics
  • Surfaces, Coatings and Films
  • Electrical and Electronic Engineering

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