摘要
Microwave dielectric properties of Ba(Mg1/3Ta 2/3)O3-series materials were investigated using Fourier transform infrared spectroscopy (FTIR) and Raman spectroscopy. The normal vibration modes of these spectra were assigned, and the origin of dielectric response of the materials was deduced. Among the prominent normal vibration modes in the FTIR spectra, those which correlated with O-layers and Ba-layers change with Sr-ratio most significantly, whereas in micro-Raman measurements, the A1g(O) phonon of oxygen-octahedron stretch mode changes with Sr-ratio most profoundly. These results reveal clearly the close relationship between the characteristics of FTIR and Raman spectra of the BMT-series materials and their microwave dielectric properties.
原文 | 英語 |
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頁(從 - 到) | 271-275 |
頁數 | 5 |
期刊 | Journal of Electroceramics |
卷 | 13 |
發行號 | 1-3 |
DOIs | |
出版狀態 | 已發佈 - 2004 7月 |
ASJC Scopus subject areas
- 電子、光磁材料
- 陶瓷和複合材料
- 凝聚態物理學
- 材料力學
- 電氣與電子工程
- 材料化學