TY - JOUR
T1 - Compton Profiles of Silver with 662 keV γ-Rays
AU - Chang, Chu Nan
AU - Lee, Syh Bin
AU - Chen, Chuhn Chih
PY - 1991/12
Y1 - 1991/12
N2 - The isotropic Compton profiles of Ag for two thicknesses, 2 mm and 4 mm, have been measured by means of 662 keV γ-rays from Cs137 source. A HpGe detector with resolution of 190 eV at 5.9 keV was used to detect the backward scattering photons. Comparison with the renormalized-free-atom model calculations was made, and the agreement between the experimental and the calculated values has been found to be good for the electron configuration 4d105s1.
AB - The isotropic Compton profiles of Ag for two thicknesses, 2 mm and 4 mm, have been measured by means of 662 keV γ-rays from Cs137 source. A HpGe detector with resolution of 190 eV at 5.9 keV was used to detect the backward scattering photons. Comparison with the renormalized-free-atom model calculations was made, and the agreement between the experimental and the calculated values has been found to be good for the electron configuration 4d105s1.
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U2 - 10.1143/JPSJ.60.4253
DO - 10.1143/JPSJ.60.4253
M3 - Article
AN - SCOPUS:13144249329
SN - 0031-9015
VL - 60
SP - 4253
EP - 4264
JO - Journal of the Physical Society of Japan
JF - Journal of the Physical Society of Japan
IS - 12
ER -