Compton Profiles of Silver with 662 keV γ-Rays

Chu-Nan Chang, Syh Bin Lee, Chuhn Chih Chen

研究成果: 雜誌貢獻期刊論文同行評審

7 引文 斯高帕斯(Scopus)

摘要

The isotropic Compton profiles of Ag for two thicknesses, 2 mm and 4 mm, have been measured by means of 662 keV γ-rays from Cs137 source. A HpGe detector with resolution of 190 eV at 5.9 keV was used to detect the backward scattering photons. Comparison with the renormalized-free-atom model calculations was made, and the agreement between the experimental and the calculated values has been found to be good for the electron configuration 4d105s1.

原文英語
頁(從 - 到)4253-4264
頁數12
期刊Journal of the Physical Society of Japan
60
發行號12
DOIs
出版狀態已發佈 - 1991 一月 1

ASJC Scopus subject areas

  • 物理與天文學 (全部)

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