Comparison and correlation of ESD HBM (Human Body Model) obtained between TLPG, wafer-level, and package-level tests

Ming T. Lee; Chuan H. Liu; Chung Chiang Lin; Jin Tau Chou; Howard T.H. Tang; Yih J. Chang; K. Y. Fu

Comparison and correlation of ESD HBM (Human Body Model) obtained between TLPG, wafer-level, and package-level tests

Ming T. Lee^*
, Chuan H. Liu
, Chung Chiang Lin
, Jin Tau Chou
, Howard T.H. Tang
, Yih J. Chang
, K. Y. Fu

^*此作品的通信作者

研究成果: 雜誌貢獻 › 會議論文 › 同行評審

7 引文斯高帕斯（Scopus）

摘要

Transmission-line pulse generator (TLPG) was found to be well correlated to human body model (HBM) by adding a parasitic series resistance. The series resistance was obtained either from the least squares error solution method or numerically from simplified LEM method. Experimental results revealed that the HBM is best described by the lognormal distribution rather than normal distribution.

原文	英語
頁（從 - 到）	105-110
頁數	6
期刊	Electrical Overstress/Electrostatic Discharge Symposium Proceedings
出版狀態	已發佈 - 2000
對外發佈	是
事件	Electrical Overstress/Electrostatic Discharge Symposium Proceedings - Anaheim, CA, USA 持續時間: 2000 9月 26 → 2000 9月 28

ASJC Scopus subject areas

凝聚態物理學

其它文件與鏈接

引用此

@article{c4baf068f7b448c686bc67073b0f4963,

title = "Comparison and correlation of ESD HBM (Human Body Model) obtained between TLPG, wafer-level, and package-level tests",

abstract = "Transmission-line pulse generator (TLPG) was found to be well correlated to human body model (HBM) by adding a parasitic series resistance. The series resistance was obtained either from the least squares error solution method or numerically from simplified LEM method. Experimental results revealed that the HBM is best described by the lognormal distribution rather than normal distribution.",

author = "Lee, \{Ming T.\} and Liu, \{Chuan H.\} and Lin, \{Chung Chiang\} and Chou, \{Jin Tau\} and Tang, \{Howard T.H.\} and Chang, \{Yih J.\} and Fu, \{K. Y.\}",

year = "2000",

language = "English",

pages = "105--110",

journal = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings",

issn = "0739-5159",

publisher = "ESD Association",

note = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings ; Conference date: 26-09-2000 Through 28-09-2000",

}

TY - JOUR

T1 - Comparison and correlation of ESD HBM (Human Body Model) obtained between TLPG, wafer-level, and package-level tests

AU - Lee, Ming T.

AU - Liu, Chuan H.

AU - Lin, Chung Chiang

AU - Chou, Jin Tau

AU - Tang, Howard T.H.

AU - Chang, Yih J.

AU - Fu, K. Y.

PY - 2000

Y1 - 2000

N2 - Transmission-line pulse generator (TLPG) was found to be well correlated to human body model (HBM) by adding a parasitic series resistance. The series resistance was obtained either from the least squares error solution method or numerically from simplified LEM method. Experimental results revealed that the HBM is best described by the lognormal distribution rather than normal distribution.

AB - Transmission-line pulse generator (TLPG) was found to be well correlated to human body model (HBM) by adding a parasitic series resistance. The series resistance was obtained either from the least squares error solution method or numerically from simplified LEM method. Experimental results revealed that the HBM is best described by the lognormal distribution rather than normal distribution.

UR - https://www.scopus.com/pages/publications/0034543579

UR - https://www.scopus.com/pages/publications/0034543579#tab=citedBy

M3 - Conference article

AN - SCOPUS:0034543579

SN - 0739-5159

SP - 105

EP - 110

JO - Electrical Overstress/Electrostatic Discharge Symposium Proceedings

JF - Electrical Overstress/Electrostatic Discharge Symposium Proceedings

T2 - Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Y2 - 26 September 2000 through 28 September 2000

ER -

Comparison and correlation of ESD HBM (Human Body Model) obtained between TLPG, wafer-level, and package-level tests

摘要

ASJC Scopus subject areas

其它文件與鏈接

指紋

引用此