Compact ESD Protection Cell for Multi-Band Millimeter-Wave Applications

Chun Yu Lin; Yi Quan Fu; Jih Yan Wang

doi:10.1109/LMWC.2019.2957204

Compact ESD Protection Cell for Multi-Band Millimeter-Wave Applications

Chun Yu Lin^*, Yi Quan Fu, Jih Yan Wang

^*此作品的通信作者

電機工程學系

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

3 引文斯高帕斯（Scopus）

摘要

A compact electrostatic discharge (ESD) protection cell is proposed for multi-band millimeter-wave (MMW) circuits in nanoscale CMOS technology. The proposed ESD protection cell consists of a silicon-controlled rectifier (SCR) and a diode as the main ESD protection devices, and an inductor in this cell is divided into several sections to resonate at multifrequencies. The proposed design has been demonstrated for 28- and 67-GHz applications. The measurement results show that the proposed design exhibits lower loss at the specified frequency bands, higher ESD robustness, and sufficiently small layout area. Therefore, the novel compact ESD protection cell will be better for multi-band MMW applications in CMOS technology.

原文	英語
文章編號	8947990
頁（從 - 到）	58-61
頁數	4
期刊	IEEE Microwave and Wireless Components Letters
卷	30
發行號	1
DOIs	https://doi.org/10.1109/LMWC.2019.2957204
出版狀態	已發佈 - 2020 1月

ASJC Scopus subject areas

凝聚態物理學
電氣與電子工程

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10.1109/LMWC.2019.2957204

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引用此

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abstract = "A compact electrostatic discharge (ESD) protection cell is proposed for multi-band millimeter-wave (MMW) circuits in nanoscale CMOS technology. The proposed ESD protection cell consists of a silicon-controlled rectifier (SCR) and a diode as the main ESD protection devices, and an inductor in this cell is divided into several sections to resonate at multifrequencies. The proposed design has been demonstrated for 28- and 67-GHz applications. The measurement results show that the proposed design exhibits lower loss at the specified frequency bands, higher ESD robustness, and sufficiently small layout area. Therefore, the novel compact ESD protection cell will be better for multi-band MMW applications in CMOS technology.",

keywords = "Electrostatic discharge (ESD), multi-band, silicon-controlled rectifier (SCR)",

author = "Lin, {Chun Yu} and Fu, {Yi Quan} and Wang, {Jih Yan}",

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AU - Lin, Chun Yu

AU - Fu, Yi Quan

AU - Wang, Jih Yan

PY - 2020/1

Y1 - 2020/1

N2 - A compact electrostatic discharge (ESD) protection cell is proposed for multi-band millimeter-wave (MMW) circuits in nanoscale CMOS technology. The proposed ESD protection cell consists of a silicon-controlled rectifier (SCR) and a diode as the main ESD protection devices, and an inductor in this cell is divided into several sections to resonate at multifrequencies. The proposed design has been demonstrated for 28- and 67-GHz applications. The measurement results show that the proposed design exhibits lower loss at the specified frequency bands, higher ESD robustness, and sufficiently small layout area. Therefore, the novel compact ESD protection cell will be better for multi-band MMW applications in CMOS technology.

AB - A compact electrostatic discharge (ESD) protection cell is proposed for multi-band millimeter-wave (MMW) circuits in nanoscale CMOS technology. The proposed ESD protection cell consists of a silicon-controlled rectifier (SCR) and a diode as the main ESD protection devices, and an inductor in this cell is divided into several sections to resonate at multifrequencies. The proposed design has been demonstrated for 28- and 67-GHz applications. The measurement results show that the proposed design exhibits lower loss at the specified frequency bands, higher ESD robustness, and sufficiently small layout area. Therefore, the novel compact ESD protection cell will be better for multi-band MMW applications in CMOS technology.

KW - Electrostatic discharge (ESD)

KW - multi-band

KW - silicon-controlled rectifier (SCR)

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Compact ESD Protection Cell for Multi-Band Millimeter-Wave Applications

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