Coherent phase locking of high-Tc YBa2Cu3Oy Josephson junctions

H. C. Yang; C. H. Wu; M. J. Chen; J. H. Chen; C. H. Chen; H. W. Yu; J. T. Jeng; H. E. Horng

doi:10.1109/77.919345

Coherent phase locking of high-T_c YBa₂Cu₃O_y Josephson junctions

H. C. Yang^*, C. H. Wu, M. J. Chen, J. H. Chen, C. H. Chen, H. W. Yu, J. T. Jeng, H. E. Horng

^*此作品的通信作者

光電工程學士學位學程

研究成果: 雜誌貢獻 › 會議論文 › 同行評審

4 引文斯高帕斯（Scopus）

摘要

We measured I-V curves and noise characteristics of high-T_c YBa₂Cu₃O_y step-edge Josephson junctions and serial junction arrays under microwave irradiation. The junctions were fabricated on step-edge MgO(100) substrates with low step angles (∼30°). The junction array shows the resistively shunted junction (RSJ) behavior for at least 50 junctions and reveals a coherent phase locking under microwave irradiation. The variation of I_c was 16% for a 150-junctions array distributed along the step-edge line of 1.5 mm in width. The voltage noise, S_v, of the serial junction array scales as the number of junctions, N. The value of S_IR, (S_IR = |(δI_c/I_c)∥(δR/R)|), for a single and 50-junctions obtained from the fluctuation measurement is consistent with the result derived from I_cR_n ∝ (J_c)^q, with q = 0.5.

原文	英語
頁（從 - 到）	308-311
頁數	4
期刊	IEEE Transactions on Applied Superconductivity
卷	11
發行號	1 I
DOIs	https://doi.org/10.1109/77.919345
出版狀態	已發佈 - 2001 3月
事件	2000 Applied Superconductivity Conference - Virginia Beach, VA, 美国持續時間: 2000 9月 17 → 2000 9月 22

ASJC Scopus subject areas

電子、光磁材料
凝聚態物理學
電氣與電子工程

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title = "Coherent phase locking of high-Tc YBa2Cu3Oy Josephson junctions",

abstract = "We measured I-V curves and noise characteristics of high-Tc YBa2Cu3Oy step-edge Josephson junctions and serial junction arrays under microwave irradiation. The junctions were fabricated on step-edge MgO(100) substrates with low step angles (∼30°). The junction array shows the resistively shunted junction (RSJ) behavior for at least 50 junctions and reveals a coherent phase locking under microwave irradiation. The variation of Ic was 16% for a 150-junctions array distributed along the step-edge line of 1.5 mm in width. The voltage noise, Sv, of the serial junction array scales as the number of junctions, N. The value of SIR, (SIR = |(δIc/Ic)∥(δR/R)|), for a single and 50-junctions obtained from the fluctuation measurement is consistent with the result derived from IcRn ∝ (Jc)q, with q = 0.5.",

keywords = "Array, Junction, Noise, SQUID",

author = "Yang, {H. C.} and Wu, {C. H.} and Chen, {M. J.} and Chen, {J. H.} and Chen, {C. H.} and Yu, {H. W.} and Jeng, {J. T.} and Horng, {H. E.}",

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month = mar,

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AU - Yang, H. C.

AU - Wu, C. H.

AU - Chen, M. J.

AU - Chen, J. H.

AU - Chen, C. H.

AU - Yu, H. W.

AU - Jeng, J. T.

AU - Horng, H. E.

PY - 2001/3

Y1 - 2001/3

N2 - We measured I-V curves and noise characteristics of high-Tc YBa2Cu3Oy step-edge Josephson junctions and serial junction arrays under microwave irradiation. The junctions were fabricated on step-edge MgO(100) substrates with low step angles (∼30°). The junction array shows the resistively shunted junction (RSJ) behavior for at least 50 junctions and reveals a coherent phase locking under microwave irradiation. The variation of Ic was 16% for a 150-junctions array distributed along the step-edge line of 1.5 mm in width. The voltage noise, Sv, of the serial junction array scales as the number of junctions, N. The value of SIR, (SIR = |(δIc/Ic)∥(δR/R)|), for a single and 50-junctions obtained from the fluctuation measurement is consistent with the result derived from IcRn ∝ (Jc)q, with q = 0.5.

AB - We measured I-V curves and noise characteristics of high-Tc YBa2Cu3Oy step-edge Josephson junctions and serial junction arrays under microwave irradiation. The junctions were fabricated on step-edge MgO(100) substrates with low step angles (∼30°). The junction array shows the resistively shunted junction (RSJ) behavior for at least 50 junctions and reveals a coherent phase locking under microwave irradiation. The variation of Ic was 16% for a 150-junctions array distributed along the step-edge line of 1.5 mm in width. The voltage noise, Sv, of the serial junction array scales as the number of junctions, N. The value of SIR, (SIR = |(δIc/Ic)∥(δR/R)|), for a single and 50-junctions obtained from the fluctuation measurement is consistent with the result derived from IcRn ∝ (Jc)q, with q = 0.5.

KW - Array

KW - Junction

KW - Noise

KW - SQUID

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DO - 10.1109/77.919345

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JO - IEEE Transactions on Applied Superconductivity

JF - IEEE Transactions on Applied Superconductivity

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ER -

Coherent phase locking of high-Tc YBa2Cu3Oy Josephson junctions

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Coherent phase locking of high-T_c YBa₂Cu₃O_y Josephson junctions