Characterizing xBa (Mg1/3Ta2/3)O3+ (1-x) Ba (Mg1/3Nb2/3)O3 microwave ceramics using extended x-ray absorption fine structure method

P. J. Chang, C. T. Chia, I. N. Lin, J. F. Lee, C. M. Lin, K. T. Wu

研究成果: 雜誌貢獻期刊論文同行評審

6 引文 斯高帕斯(Scopus)

摘要

The structures of Ta O6 and Nb O6 oxygen octahedra in xBa (Mg13 Ta23) O3 + (1-x) Ba (Mg13 Nb23) O3 perovskite ceramics with x=0, 0.25, 0.50, 0.75, and 1.0 were investigated by the extended x-ray absorption fine structure method. The decline in the microwave dielectric constant as x increases is caused mainly by the decrease of the mean volume of the oxygen octahedra, regardless of the 1:2 ordered structure and the distortion of the oxygen octahedron. The low Qf values of the Ta O6 and Nb O6 mixed samples are caused by not only the degrading of the 1:2 ordered structure but also the distortion of oxygen octahedral cages.

原文英語
文章編號242907
期刊Applied Physics Letters
88
發行號24
DOIs
出版狀態已發佈 - 2006 六月 12

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

指紋 深入研究「Characterizing xBa (Mg<sub>1/3</sub>Ta<sub>2/3</sub>)O<sub>3</sub>+ (1-x) Ba (Mg<sub>1/3</sub>Nb<sub>2/3</sub>)O<sub>3</sub> microwave ceramics using extended x-ray absorption fine structure method」主題。共同形成了獨特的指紋。

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