摘要
I-V, V-O characteristics and atomic force images of grain boundary Josephson junctions fabricated on SrTiO, bicrystal substrates were investigated. The half integer Shapiro steps and I, versus B curves show evidence of the inhomogeneous current distribution along the grain boundary junction. The dc SQUID formed on the grain boundary shows the expected V-O curve. The AFM images, R-T curves and IeRn product reveal sequential destructive deterioration of the junction originating from the underlying grooved substrate. The results are discussed.
原文 | 英語 |
---|---|
頁(從 - 到) | 3101-3104 |
頁數 | 4 |
期刊 | IEEE Transactions on Applied Superconductivity |
卷 | 9 |
發行號 | 2 PART 3 |
DOIs | |
出版狀態 | 已發佈 - 1999 |
對外發佈 | 是 |
ASJC Scopus subject areas
- 電子、光磁材料
- 凝聚態物理學
- 電氣與電子工程