Characterization of grain boundaries in YBa2Cu3Oy bicrystal junctions

Hsiao-Wen Yu Hsiao-Wen, Ming Jye Chen, Hong Chang Yang, S. Y. Yang, H. E. Horng

研究成果: 雜誌貢獻期刊論文同行評審

7 引文 斯高帕斯(Scopus)


I-V, V-O characteristics and atomic force images of grain boundary Josephson junctions fabricated on SrTiO, bicrystal substrates were investigated. The half integer Shapiro steps and I, versus B curves show evidence of the inhomogeneous current distribution along the grain boundary junction. The dc SQUID formed on the grain boundary shows the expected V-O curve. The AFM images, R-T curves and IeRn product reveal sequential destructive deterioration of the junction originating from the underlying grooved substrate. The results are discussed.

頁(從 - 到)3101-3104
期刊IEEE Transactions on Applied Superconductivity
發行號2 PART 3
出版狀態已發佈 - 1999

ASJC Scopus subject areas

  • 電子、光磁材料
  • 凝聚態物理學
  • 電氣與電子工程


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