Characteristics of YBa2Cu3O7-y Josephson junctions prepared with smooth ramp-edge surfaces

L. M. Wang; H. H. Sung; H. C. Yang; M. J. Chen; C. H. Wu; N. L. Chiu; H. E. Horng

doi:10.1016/S0921-4534(00)01460-X

Characteristics of YBa₂Cu₃O_7-y Josephson junctions prepared with smooth ramp-edge surfaces

L. M. Wang^*
, H. H. Sung
, H. C. Yang
, M. J. Chen
, C. H. Wu
, N. L. Chiu
, H. E. Horng

^*此作品的通信作者

光電工程研究所暨學士學位學程

研究成果: 雜誌貢獻 › 會議論文 › 同行評審

2 引文斯高帕斯（Scopus）

摘要

YBa₂Cu₃O_7-y ramp-type Josephson junctions with PrBa₂Cu₃O_7-y and SrTiO₃ barriers have been fabricated on SrTiO₃ (001) substrates. The surface morphology of the ramp-edge was examined using the atomic force microscope (AFM). The conditions of the photolithography process and the ion beam incident angle were optimized to improve the surface roughness at the ramp-edge. Typically, smooth surfaces at the ramp-edge with a ramp angle of about 25° and an average roughness of about 3 nm was achieved. Results indicate the junction properties are improved with a smooth ramp-edge surface. The details are discussed.

原文	英語
頁（從 - 到）	2729-2730
頁數	2
期刊	Physica C: Superconductivity and its Applications
卷	341-348 (IV)
DOIs	https://doi.org/10.1016/S0921-4534(00)01460-X
出版狀態	已發佈 - 2000 11月
事件	International Conference on Materials and Mechanisms of Superconductivity High Temperature Superconductors VI - Houston, TX, USA 持續時間: 2000 2月 20 → 2000 2月 25

ASJC Scopus subject areas

電子、光磁材料
凝聚態物理學
能源工程與電力技術
電氣與電子工程

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10.1016/S0921-4534(00)01460-X

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@article{e99dab30884940058e819ee9b7f1fd81,

title = "Characteristics of YBa2Cu3O7-y Josephson junctions prepared with smooth ramp-edge surfaces",

abstract = "YBa2Cu3O7-y ramp-type Josephson junctions with PrBa2Cu3O7-y and SrTiO3 barriers have been fabricated on SrTiO3 (001) substrates. The surface morphology of the ramp-edge was examined using the atomic force microscope (AFM). The conditions of the photolithography process and the ion beam incident angle were optimized to improve the surface roughness at the ramp-edge. Typically, smooth surfaces at the ramp-edge with a ramp angle of about 25° and an average roughness of about 3 nm was achieved. Results indicate the junction properties are improved with a smooth ramp-edge surface. The details are discussed.",

author = "Wang, \{L. M.\} and Sung, \{H. H.\} and Yang, \{H. C.\} and Chen, \{M. J.\} and Wu, \{C. H.\} and Chiu, \{N. L.\} and Horng, \{H. E.\}",

note = "Funding Information: *Supported by the National Science Council of lLO.C, under grant No. NSC 89-2112-M-212-001; International Conference on Materials and Mechanisms of Superconductivity High Temperature Superconductors VI ; Conference date: 20-02-2000 Through 25-02-2000",

year = "2000",

month = nov,

doi = "10.1016/S0921-4534(00)01460-X",

language = "English",

volume = "341-348 (IV)",

pages = "2729--2730",

journal = "Physica C: Superconductivity and its Applications",

issn = "0921-4534",

publisher = "Elsevier BV",

}

TY - JOUR

T1 - Characteristics of YBa2Cu3O7-y Josephson junctions prepared with smooth ramp-edge surfaces

AU - Wang, L. M.

AU - Sung, H. H.

AU - Yang, H. C.

AU - Chen, M. J.

AU - Wu, C. H.

AU - Chiu, N. L.

AU - Horng, H. E.

N1 - Funding Information: *Supported by the National Science Council of lLO.C, under grant No. NSC 89-2112-M-212-001

PY - 2000/11

Y1 - 2000/11

N2 - YBa2Cu3O7-y ramp-type Josephson junctions with PrBa2Cu3O7-y and SrTiO3 barriers have been fabricated on SrTiO3 (001) substrates. The surface morphology of the ramp-edge was examined using the atomic force microscope (AFM). The conditions of the photolithography process and the ion beam incident angle were optimized to improve the surface roughness at the ramp-edge. Typically, smooth surfaces at the ramp-edge with a ramp angle of about 25° and an average roughness of about 3 nm was achieved. Results indicate the junction properties are improved with a smooth ramp-edge surface. The details are discussed.

AB - YBa2Cu3O7-y ramp-type Josephson junctions with PrBa2Cu3O7-y and SrTiO3 barriers have been fabricated on SrTiO3 (001) substrates. The surface morphology of the ramp-edge was examined using the atomic force microscope (AFM). The conditions of the photolithography process and the ion beam incident angle were optimized to improve the surface roughness at the ramp-edge. Typically, smooth surfaces at the ramp-edge with a ramp angle of about 25° and an average roughness of about 3 nm was achieved. Results indicate the junction properties are improved with a smooth ramp-edge surface. The details are discussed.

UR - https://www.scopus.com/pages/publications/0343397360

UR - https://www.scopus.com/pages/publications/0343397360#tab=citedBy

U2 - 10.1016/S0921-4534(00)01460-X

DO - 10.1016/S0921-4534(00)01460-X

M3 - Conference article

AN - SCOPUS:0343397360

SN - 0921-4534

VL - 341-348 (IV)

SP - 2729

EP - 2730

JO - Physica C: Superconductivity and its Applications

JF - Physica C: Superconductivity and its Applications

T2 - International Conference on Materials and Mechanisms of Superconductivity High Temperature Superconductors VI

Y2 - 20 February 2000 through 25 February 2000

ER -

Characteristics of YBa2Cu3O7-y Josephson junctions prepared with smooth ramp-edge surfaces

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ASJC Scopus subject areas

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Characteristics of YBa₂Cu₃O_7-y Josephson junctions prepared with smooth ramp-edge surfaces