Characteristics of YBa2Cu3O7-y Josephson junctions prepared with smooth ramp-edge surfaces

L. M. Wang*, H. H. Sung, H. C. Yang, M. J. Chen, C. H. Wu, N. L. Chiu, H. E. Horng

*此作品的通信作者

研究成果: 雜誌貢獻會議論文同行評審

2 引文 斯高帕斯(Scopus)

摘要

YBa2Cu3O7-y ramp-type Josephson junctions with PrBa2Cu3O7-y and SrTiO3 barriers have been fabricated on SrTiO3 (001) substrates. The surface morphology of the ramp-edge was examined using the atomic force microscope (AFM). The conditions of the photolithography process and the ion beam incident angle were optimized to improve the surface roughness at the ramp-edge. Typically, smooth surfaces at the ramp-edge with a ramp angle of about 25° and an average roughness of about 3 nm was achieved. Results indicate the junction properties are improved with a smooth ramp-edge surface. The details are discussed.

原文英語
頁(從 - 到)2729-2730
頁數2
期刊Physica C: Superconductivity and its applications
341-348 (IV)
DOIs
出版狀態已發佈 - 2000 十一月
事件International Conference on Materials and Mechanisms of Superconductivity High Temperature Superconductors VI - Houston, TX, USA
持續時間: 2000 二月 202000 二月 25

ASJC Scopus subject areas

  • 電子、光磁材料
  • 凝聚態物理學
  • 能源工程與電力技術
  • 電氣與電子工程

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