YBa2Cu3O7-y ramp-type Josephson junctions with PrBa2Cu3O7-y and SrTiO3 barriers have been fabricated on SrTiO3 (001) substrates. The surface morphology of the ramp-edge was examined using the atomic force microscope (AFM). The conditions of the photolithography process and the ion beam incident angle were optimized to improve the surface roughness at the ramp-edge. Typically, smooth surfaces at the ramp-edge with a ramp angle of about 25° and an average roughness of about 3 nm was achieved. Results indicate the junction properties are improved with a smooth ramp-edge surface. The details are discussed.
|頁（從 - 到）||2729-2730|
|期刊||Physica C: Superconductivity and its applications|
|出版狀態||已發佈 - 2000 十一月|
|事件||International Conference on Materials and Mechanisms of Superconductivity High Temperature Superconductors VI - Houston, TX, USA|
持續時間: 2000 二月 20 → 2000 二月 25
ASJC Scopus subject areas