@article{f8692712e1c64fa29561c2206c717355,
title = "Characteristics of high-Tc josephson junction fabricated by focused ION beam and ION damage",
abstract = "A high-Tc Josephson junction and superconducting quantum interference devices (SQUIDs) were fabricated by focused ion beam (FIB) milling and 150 keV oxygen ion implantation. A single layer gold mask with a small aperture of 28-73 nm defined by direct milling with FIB, was used. The voltage versus current characteristics of high-Tc YBa2Cu 3O7-x Josephson junctions were measured under microwaves. Shapiro steps were observed in the single junction. The voltage versus current and voltage versus magnetic field characteristics of a SQUID were measured.",
keywords = "Focused ion beam, Ion implantation, Josephson junction, SQUID",
author = "Wu, \{Chiu Hsien\} and Kuo, \{Wei Cheng\} and Chou, \{Yu Te\} and Chen, \{Jau Han\} and Yang, \{Hong Chang\}",
note = "Funding Information: Manuscript received August 26, 2008. First published June 30, 2009; current version published July 10, 2009. This work was supported by the National Science Council of Taiwan (NSC95-2112-M005-016-MY3). C.-H. Wu is with the Department of Physics, National Chung Hsing University, Taichung 40227 Taiwan (e-mail:
[email protected]). W.-C. Kuo and Y.-T. Chou were with Tunghai University, Taichung 40704 Taiwan. J.-H. Chen is with the Department of Electrical Engineering, Da-Yeh University, Changhwa 51591 Taiwan. H.-C. Yang is with the Department of Physics, National Taiwan University, Taipei 10617 Taiwan. Color versions of one or more of the figures in this paper are available online at http://ieeexplore.ieee.org. Digital Object Identifier 10.1109/TASC.2009.2018366",
year = "2009",
month = jun,
doi = "10.1109/TASC.2009.2018366",
language = "English",
volume = "19",
pages = "210--213",
journal = "IEEE Transactions on Applied Superconductivity",
issn = "1051-8223",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "3",
}