Boundary scan for 5-GHz RF pins using LC isolation networks

Tian Wei Huang*, Pei Si Wu, Ren Chieh Liu, Jeng Han Tsai, Huei Wang, Tzi Dar Chiueh

*此作品的通信作者

研究成果: 會議貢獻類型會議論文同行評審

摘要

The boundary-scan test provides a structural test solution for the densely packed digital electronics. For RF devices, the structural test also provides a good diagnostic resolution to the structural defects of RF circuits, especially for the high pin-count RF-SOCs. In this paper, the boundary-scan test is implemented on a 5-GHz RF pin using LC isolation networks to connect the RF lines and the boundary-scan cell, which isolates the RF circuitry from the digital boundary scan cell. This technique overcomes the parasitic loading problems and provides a minimum RF performance degradation to a RFIC. The measurement results show only 0.4-dB gain degradation in a 5-GHz amplifier with a boundary-scan cell and LC isolation networks.

原文英語
頁面347-350
頁數4
出版狀態已發佈 - 2004
對外發佈
事件Proceedings - 22nd IEEE VLSI Test Symposium - Napa Valley, CA, 美国
持續時間: 2004 4月 252004 4月 29

其他

其他Proceedings - 22nd IEEE VLSI Test Symposium
國家/地區美国
城市Napa Valley, CA
期間2004/04/252004/04/29

ASJC Scopus subject areas

  • 電腦科學應用
  • 電氣與電子工程

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