Automatic functional test program generation for microprocessors.

Cheng Shang Lin*, Hong-Fa Ho

*此作品的通信作者

研究成果: 書貢獻/報告類型會議論文篇章

2 引文 斯高帕斯(Scopus)

摘要

A algorithm called the O-algorithm is introduced for automatic test program generation of microprocessors in a user environment. To eliminate redundant tests, a weighted-digraph model is used to model the signal flow of the general microprocessors. Improved functional fault models of microprocessors are derived from the Turing machine model. The O-algorithm is then constructed on the basis of the signal flow model and functional fault models. Simulation has shown that the fault coverage is better than 97%.

原文英語
主出版物標題Proceedings - Design Automation Conference
發行者Publ by IEEE
頁面605-608
頁數4
ISBN(列印)0818688645
出版狀態已發佈 - 1988 十二月 1

出版系列

名字Proceedings - Design Automation Conference
ISSN(列印)0146-7123

ASJC Scopus subject areas

  • 工程 (全部)

指紋

深入研究「Automatic functional test program generation for microprocessors.」主題。共同形成了獨特的指紋。

引用此