Automated surface defect inspection based on autoencoders and fully convolutional neural networks

Cheng Wei Lei, Li Zhang, Tsung Ming Tai, Chen Chieh Tsai, Wen Jyi Hwang*, Yun Jie Jhang

*此作品的通信作者

研究成果: 雜誌貢獻期刊論文同行評審

2 引文 斯高帕斯(Scopus)

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INIS

Physics

Material Science

Computer Science