摘要
We map electronic states, band gaps, and interface-bound charges at termination-engineered BiFeO3/La0.7Sr0.3MnO3 interfaces using atomically resolved cross-sectional scanning tunneling microscopy. We identify a delicate interplay of different correlated physical effects and relate these to the ferroelectric and magnetic interface properties tuned by engineering the atomic layer stacking sequence at the interfaces. This study highlights the importance of a direct atomically resolved access to electronic interface states for understanding the intriguing interface properties in complex oxides.
原文 | 英語 |
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頁(從 - 到) | 1089-1095 |
頁數 | 7 |
期刊 | ACS Nano |
卷 | 12 |
發行號 | 2 |
DOIs | |
出版狀態 | 已發佈 - 2018 2月 27 |
ASJC Scopus subject areas
- 一般材料科學
- 一般工程
- 一般物理與天文學