摘要
The proposed antiferroelectric capacitive memory (AFE-FCM) achieves a symmetric capacitive memory window (CMW) of ∼ 6× ϵ0 with non-destructive readout (NDR) at 0V. The asymmetric capacitance loop (ACL) operation achieves CMW with reduced drive voltage range -1.5V to + 3V or -3V to + 1.5V. The sensing circuit of FCM verifies a significant improvement in sensing voltage for AFE compared to FE. The read endurance with NDR remains beyond 109 cycling. The NDR characteristic gradually transitions to destructive readout (DR) due to the program/erase endurance, which accumulates the imprint effect. The strategy will be proposed to eliminate DR and prolong endurance through a recovery scheme, with a 100-period demonstration. The proposed AFE-FCM boasts promising metrics, including high CMW, NDR, long endurance, a crossbar architecture, a simple structure, and treatment-free capabilities.
| 原文 | 英語 |
|---|---|
| 頁(從 - 到) | 1101-1104 |
| 頁數 | 4 |
| 期刊 | IEEE Electron Device Letters |
| 卷 | 47 |
| 發行號 | 6 |
| DOIs | |
| 出版狀態 | 已發佈 - 2026 6月 1 |
| 對外發佈 | 是 |
ASJC Scopus subject areas
- 電子、光磁材料
- 電氣與電子工程
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