Anomalous behavior of LEED beam intensity during annealing

Tsu Yi Fu, T. F. Liu, C. W. Su, C. S. Shern, R. H. Chen

研究成果: 雜誌貢獻期刊論文同行評審

摘要

Low-energy electron diffraction was used to study the annealing effects of 1 ML Ag on the ultra-thin-film Co/Pt (111). The behavior of the specular beam intensity versus temperature is anomalous. Besides the normal Debye-Waller effect, a bend occurs at 550 K, and a dramatic increase occurs at a higher temperature. A corresponding study by Auger electron spectroscopy and ultraviolet photoelectron spectroscopy indicates that the bend results from the Co inter-diffusion. The anomalous increase indicates that a more stable state forms at a higher temperature. The Co coverage plays an important role in determining the turning temperature. Possible mechanisms are discussed.

原文英語
頁(從 - 到)211-216
頁數6
期刊Surface Science
464
發行號2-3
DOIs
出版狀態已發佈 - 2000 十月 1

ASJC Scopus subject areas

  • 凝聚態物理學
  • 表面和介面
  • 表面、塗料和薄膜
  • 材料化學

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