Annealing effects and structural evolution of Si/Cu(1 1 1) ultrathin films

J. S. Tsay*, A. B. Yang, C. N. Wu, F. S. Shiu


研究成果: 雜誌貢獻期刊論文同行評審

5 引文 斯高帕斯(Scopus)


The surface structure and compositions of the Si/Cu(1 1 1) system have been systematically investigated. As Si atoms are deposited on a Cu(1 1 1) surface, a sqrt(3) × sqrt(3) R 30 ° structure is observed for up to 2 monolayers. The surface structure changes to be 1 × 1 for thicker films. As the annealing temperature increases, most Si atoms diffuse into the Cu(1 1 1) substrate. The residual Si atoms in the top layer form an ordered surface alloy that lies on a Cu-rich surface. A structural phase diagram is successfully established for Si/Cu(1 1 1) films thinner than 5 monolayers at temperatures up to 600 K. The phase diagram can be divided into three regions. In region I for low coverage or at high temperatures, the films exhibit sqrt(3) × sqrt(3) R 30 ° structure. In regions II and III, 1 × 1 and disordered surface structure are resolved, respectively.

頁(從 - 到)4265-4269
期刊Surface Science
出版狀態已發佈 - 2007 9月 15

ASJC Scopus subject areas

  • 凝聚態物理學
  • 表面和介面
  • 表面、塗料和薄膜
  • 材料化學


深入研究「Annealing effects and structural evolution of Si/Cu(1 1 1) ultrathin films」主題。共同形成了獨特的指紋。