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Annealing effect on the microstructure and optical characterization of Zn
2
SiO
4
thin film sputtered on quartz glass
Kun Cheng Peng
*
, Hao Che Kao,
Shiu Jen Liu
, Kuei Lan Tsai, Jing Chie Lin
*
此作品的通信作者
物理學系
研究成果
:
雜誌貢獻
›
期刊論文
›
同行評審
8
引文 斯高帕斯(Scopus)
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深入研究「Annealing effect on the microstructure and optical characterization of Zn
2
SiO
4
thin film sputtered on quartz glass」主題。共同形成了獨特的指紋。
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INIS
microstructure
100%
films
100%
glass
100%
annealing
100%
thin films
100%
quartz
100%
zinc oxides
57%
thickness
28%
transmission electron microscopy
28%
sputtering
28%
resolution
14%
surfaces
14%
power
14%
morphology
14%
scanning electron microscopy
14%
emission
14%
substrates
14%
photoluminescence
14%
oxides
14%
luminescence
14%
radiowave radiation
14%
purity
14%
field emission
14%
oxygen ions
14%
silicon ions
14%
zinc ions
14%
Material Science
Film
100%
Microstructure
100%
Thin Films
100%
Characterization
100%
ZnO
100%
Glass
100%
Temperature
75%
Annealing
50%
Morphology
25%
Surface
25%
Photoluminescence
25%
Luminescence
25%
Oxide Film
25%
Sputtered Film
25%
Indium Ion
25%
Silicon Ion
25%
Physics
Glass
100%
Thin Films
100%
Annealing Effect
100%
ZnO
100%
Temperature
75%
Annealing
50%
Transmission Electron Microscopy
50%
Frequencies
25%
Photoluminescence
25%
Scanning Electron Microscopy
25%
Emission
25%
Substrates
25%
Silicon
25%
Luminescence
25%
Targets
25%
Ion
25%
Act
25%
High Resolution
25%
Field Emission
25%
Oxygen Ion
25%
Biochemistry, Genetics and Molecular Biology
Temperature
100%
Optics
100%
Thickness
66%
Photoluminescence
33%
Morphology
33%
Luminescence
33%
Surface Property
33%
Radiofrequency
33%
Field Emission Scanning Electron Microscopy
33%
High-Resolution Transmission Electron Microscopy
33%
Scanning Transmission Electron Microscopy
33%