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學生論文
Annealing effect on the microstructure and optical characterization of Zn
2
SiO
4
thin film sputtered on quartz glass
Kun Cheng Peng
*
, Hao Che Kao
, Shiu Jen Liu
, Kuei Lan Tsai
, Jing Chie Lin
*
此作品的通信作者
物理學系
研究成果
:
雜誌貢獻
›
期刊論文
›
同行評審
9
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引文 斯高帕斯(Scopus)
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深入研究「Annealing effect on the microstructure and optical characterization of Zn
2
SiO
4
thin film sputtered on quartz glass」主題。共同形成了獨特的指紋。
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INIS
microstructure
100%
films
100%
glass
100%
annealing
100%
thin films
100%
quartz
100%
zinc oxides
57%
thickness
28%
transmission electron microscopy
28%
sputtering
28%
resolution
14%
surfaces
14%
power
14%
morphology
14%
scanning electron microscopy
14%
emission
14%
substrates
14%
photoluminescence
14%
oxides
14%
luminescence
14%
radiowave radiation
14%
purity
14%
field emission
14%
oxygen ions
14%
silicon ions
14%
zinc ions
14%
magnetrons
14%
Engineering
Thin Films
100%
Silicon Dioxide
100%
Annealing Effect
100%
Power Source
33%
Magnetron
33%
Annealing Temperature
33%
Elevated Temperature
33%
Field-Emission Scanning Electron Microscopy
33%
Radio Frequency
33%
High Resolution
33%
Glass Substrate
33%
Oxide Film
33%
Oxygen Ion
33%
Material Science
Film
100%
Thin Films
100%
ZnO
80%
Annealing
40%
Photoluminescence
20%
Luminescence
20%
Scanning Transmission Electron Microscopy
20%
Oxide Film
20%
Sputtered Film
20%
High-Resolution Transmission Electron Microscopy
20%
Silicon Ion
20%
Field Emission Scanning Electron Microscopy
20%
Surface (Surface Science)
20%