Annealing effect of ultrathin Ag films on Ni/Pt (111)

C. W. Su; H. Y. Yo; Y. J. Chen; C. S. Shern

doi:10.1063/1.1929888

Annealing effect of ultrathin Ag films on Ni/Pt (111)

C. W. Su, H. Y. Yo, Y. J. Chen, C. S. Shern^*

^*此作品的通信作者

物理學系

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

3 引文斯高帕斯（Scopus）

摘要

The epitaxial growth and alloy formation of Ag-capped layer on NiPt (111) surface were investigated using Auger electron spectroscopy, ultraviolet photoelectron spectroscopy, and low-energy electron diffraction. The growth of Ag on one ML NiPt (111) transforms from layer-by-layer mode into three-dimensional island mode after the growth of one atomic monolayer of Ag. The starting temperature for the alloy formation of Ni-Pt is dependent of the thickness of Ni films. The interface compositions after the high-temperature annealing were studied with the depth-profile analysis of Ar ion sputtering.

原文	英語
文章編號	124907
期刊	Journal of Applied Physics
卷	97
發行號	12
DOIs	https://doi.org/10.1063/1.1929888
出版狀態	已發佈 - 2005

ASJC Scopus subject areas

一般物理與天文學

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Y1 - 2005

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AB - The epitaxial growth and alloy formation of Ag-capped layer on NiPt (111) surface were investigated using Auger electron spectroscopy, ultraviolet photoelectron spectroscopy, and low-energy electron diffraction. The growth of Ag on one ML NiPt (111) transforms from layer-by-layer mode into three-dimensional island mode after the growth of one atomic monolayer of Ag. The starting temperature for the alloy formation of Ni-Pt is dependent of the thickness of Ni films. The interface compositions after the high-temperature annealing were studied with the depth-profile analysis of Ar ion sputtering.

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Annealing effect of ultrathin Ag films on Ni/Pt (111)

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