Analysis of defect mode in a dielectric photonic crystal containing ITO defect

Chi Chung Liu, Chien Jang Wu*

*此作品的通信作者

研究成果: 雜誌貢獻期刊論文同行評審

11 引文 斯高帕斯(Scopus)

摘要

In this work, based on the use of ITO as a defect, we study the infrared defect mode in defective photonic crystal made of SiO2 and InP. Due to the dispersion in the dielectric function of ITO, it is found that the defect mode is sensitive to the ITO thickness. The defect frequency is shown to be blue-shifted as the thickness of ITO decreases. In the angular dependence of defect mode, it is seen that the defect frequency is also blue-shifted when the angle of incidence increases for both TE and TM polarizations. However, the shifting feature is appeared to be nearly polarization-independent. The shift in the defect frequency enables us to employ ITO as a tunable agent in order to design a tunable photonic crystal filter in the infrared region.

原文英語
頁(從 - 到)7140-7142
頁數3
期刊Optik
125
發行號24
DOIs
出版狀態已發佈 - 2014 十二月 1

ASJC Scopus subject areas

  • 電子、光磁材料
  • 原子與分子物理與光學
  • 電氣與電子工程

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