An Informative Test Code Approach for Studying Three Object-Oriented Programming Concepts by Code Writing Problem in Java Programming Learning Assistant System

Khin Khin Zaw, Nobuo Funabiki, Ei Ei Mon, Wen Chung Kao

研究成果: 書貢獻/報告類型會議貢獻

摘要

To assist Java programming educations, we have developed a Web-based Java Programming Learning Assistant System (JPLAS) along with the code writing problem which allows students to study writing source codes for assignments. As the object-oriented programming language, encapsulation, inheritance, and polymorphism are the three fundamental concepts that all the students are expected to master. In this paper, we propose the informative test code approach to the code writing problem, which helps students study them by describing the necessary information for the code. For evaluations, we generated informative test codes for 10 assignments, and then asked 10 students to write the source codes, where they completed the high-quality ones using the concepts.

原文英語
主出版物標題2018 IEEE 7th Global Conference on Consumer Electronics, GCCE 2018
發行者Institute of Electrical and Electronics Engineers Inc.
頁面629-633
頁數5
ISBN(電子)9781538663097
DOIs
出版狀態已發佈 - 2018 十二月 12
事件7th IEEE Global Conference on Consumer Electronics, GCCE 2018 - Nara, 日本
持續時間: 2018 十月 92018 十月 12

出版系列

名字2018 IEEE 7th Global Conference on Consumer Electronics, GCCE 2018

其他

其他7th IEEE Global Conference on Consumer Electronics, GCCE 2018
國家日本
城市Nara
期間18/10/918/10/12

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality
  • Instrumentation

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    Zaw, K. K., Funabiki, N., Mon, E. E., & Kao, W. C. (2018). An Informative Test Code Approach for Studying Three Object-Oriented Programming Concepts by Code Writing Problem in Java Programming Learning Assistant System. 於 2018 IEEE 7th Global Conference on Consumer Electronics, GCCE 2018 (頁 629-633). [8574687] (2018 IEEE 7th Global Conference on Consumer Electronics, GCCE 2018). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/GCCE.2018.8574687