摘要
A low-cost process with electron beam evaporator deposition for amorphous layers was demonstrated in hetero-junction with intrinsic thin layer (HIT) solar cell. The cleaning process with saw damage removal procedure and the annealing temperature are also discussed in this work. The open-circuit voltage (Voc) and short-circuit current density (Jsc) were obtained as 285 mV and 2.9 mA/cm2, respectively, with 5 min saw damage removal and 450°C forming gas annealing. Therefore, the low-cost process with the electron beam evaporator deposition could possibly fabricate the HIT solar cell and be a candidate for future higher performance photovoltaic device with optimisation process condition.
原文 | 英語 |
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頁(從 - 到) | 485-491 |
頁數 | 7 |
期刊 | International Journal of Nanotechnology |
卷 | 13 |
發行號 | 7 |
DOIs | |
出版狀態 | 已發佈 - 2016 |
ASJC Scopus subject areas
- 生物工程
- 凝聚態物理學
- 電氣與電子工程
- 材料化學