A yield and reliability enhancement framework for image processing applications

Tong Yu Hsieh*, Chia Chi Ku, Chia Hung Yeh

*此作品的通信作者

研究成果: 書貢獻/報告類型會議論文篇章

摘要

How to improve yield and reliability of an electronic system has been a challenging problem, especially for mission-critical applications such as automotive electronics. In the literature many image enhancement methods have been developed to increase the quality of a given image whenever needed. However these methods mainly deal with unsatisfying yet error-free images. In this paper we present a yield and reliability enhancement framework that can cope with both fault-free circuits and faulty ones by combining image enhancement and testing methods. By carefully evaluating image quality, the proposed framework can not only improve the quality of an error-free image, but also reduce the error significance of an unacceptable erroneous image so as to maximize their acceptability in a certain application. The experimental results show that minor vibrations in images are almost insensible and one can easily increase the acceptability of an image using an appropriate image enhancement method.

原文英語
主出版物標題2012 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2012
頁面683-686
頁數4
DOIs
出版狀態已發佈 - 2012
對外發佈
事件2012 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2012 - Kaohsiung, 臺灣
持續時間: 2012 12月 22012 12月 5

出版系列

名字IEEE Asia-Pacific Conference on Circuits and Systems, Proceedings, APCCAS

其他

其他2012 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2012
國家/地區臺灣
城市Kaohsiung
期間2012/12/022012/12/05

ASJC Scopus subject areas

  • 電氣與電子工程

指紋

深入研究「A yield and reliability enhancement framework for image processing applications」主題。共同形成了獨特的指紋。

引用此