摘要
A time-to-digital-converter-based CMOS smart temperature sensor without a voltage/current analog-to-digital converter (ADC) or bandgap reference is proposed for high-accuracy portable applications. Conventional smart temperature sensors rely on voltage/current ADCs for digital output code conversion. For the purpose of cost reduction and power savings, the proposed smart temperature sensor first generates a pulse with a width proportional to the measured temperature. Then, a cyclic time-to-digital converter is utilized to convert the pulse into a corresponding digital code. The test chips have an extremely small area of 0.175 mm2 and were fabricated in the TSMC CMOS 0.35-μm 2P4M process. Due to the excellent linearity of the digital output, the achieved measurement error is merely -0.7 ∼ +0.9°C after two point calibration, but without any curvature correction or dynamic offset cancellation. The effective resolution is better than 0.16°C, and the power consumption is under 10 μW at a sample rate of 2 samples/s.
原文 | 英語 |
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頁(從 - 到) | 1642-1648 |
頁數 | 7 |
期刊 | IEEE Journal of Solid-State Circuits |
卷 | 40 |
發行號 | 8 |
DOIs | |
出版狀態 | 已發佈 - 2005 8月 |
對外發佈 | 是 |
ASJC Scopus subject areas
- 電氣與電子工程