A study to performance of electroplating solder bump in assembly

Mu Chun Wang*, Kuo Shu Huang, Zhen Ying Hsieh, Hsin Chia Yang, Chuan Hsi Liu, Chii Ruey Lin

*此作品的通信作者

研究成果: 書貢獻/報告類型會議論文篇章

2 引文 斯高帕斯(Scopus)

摘要

The electroplating methodology in assembly is better than the stencil printing manufacturing in pre-WLCSP (wafer-level chip-scale packaging), especially in quality. Through eightstep process requiring one photolithographic mask, the pre-WLCSP procedures for the electroplating solder bump technology are able to be completed. Comparing this technology with the electroplating gold bump technology, the cost in the previous is more impressive even though the performance of this technology is little lower than the last. Therefore, in this study, the electroplating solder bump in assembly was probed in detail to analyze the possibility of mass-production.

原文英語
主出版物標題Proceedings - 2010 11th International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP 2010
頁面794-797
頁數4
DOIs
出版狀態已發佈 - 2010
事件2010 11th International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP 2010 - Xi'an, 中国
持續時間: 2010 8月 162010 8月 19

出版系列

名字Proceedings - 2010 11th International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP 2010

其他

其他2010 11th International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP 2010
國家/地區中国
城市Xi'an
期間2010/08/162010/08/19

ASJC Scopus subject areas

  • 電氣與電子工程

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