TY - GEN
T1 - A novel design of P-N staggered face-tunneling TFET targeting for low power and appropriate performance applications
AU - Hsieh, E. R.
AU - Fan, Y. C.
AU - Chang, K. Y.
AU - Liu, C. H.
AU - Chien, C. H.
AU - Chung, Steve S.
N1 - Publisher Copyright:
© 2017 IEEE.
PY - 2017/6/7
Y1 - 2017/6/7
N2 - A novel complementary tunneling FET (C-TFET) has been designed and targeted for the low power and appropriate performance applications (Apps). In this new architecture of C-TFET, the drain and source (D/S) are configured as a staggered structure to increase the tunneling current, and the conventional p-i-n junction C-TFET has been modified as a p-n junction to further enhance the Ion current. The results show that new design can achieve 310uA/um(n), 440uA/um(p) TFETs of Ion, comparable to those of LP planar CMOS devices, 0.1 nA/um of Ioff, while excellent S.S.(<10mV/dec) at Vdd= 0.7V, which will be a promising candidate for the low-power and appropriate performance apps in the next decade.
AB - A novel complementary tunneling FET (C-TFET) has been designed and targeted for the low power and appropriate performance applications (Apps). In this new architecture of C-TFET, the drain and source (D/S) are configured as a staggered structure to increase the tunneling current, and the conventional p-i-n junction C-TFET has been modified as a p-n junction to further enhance the Ion current. The results show that new design can achieve 310uA/um(n), 440uA/um(p) TFETs of Ion, comparable to those of LP planar CMOS devices, 0.1 nA/um of Ioff, while excellent S.S.(<10mV/dec) at Vdd= 0.7V, which will be a promising candidate for the low-power and appropriate performance apps in the next decade.
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U2 - 10.1109/VLSI-TSA.2017.7942487
DO - 10.1109/VLSI-TSA.2017.7942487
M3 - Conference contribution
AN - SCOPUS:85023185224
T3 - 2017 International Symposium on VLSI Technology, Systems and Application, VLSI-TSA 2017
BT - 2017 International Symposium on VLSI Technology, Systems and Application, VLSI-TSA 2017
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2017 International Symposium on VLSI Technology, Systems and Application, VLSI-TSA 2017
Y2 - 24 April 2017 through 27 April 2017
ER -