TY - GEN
T1 - A hierarchical deformation model for on-line cursive script recognition
AU - Chen, Wen Tsuen
AU - Chou, Tzren Ru
N1 - Publisher Copyright:
© 1992 Institute of Electrical and Electronics Engineers Inc. All rights reserved.
PY - 1992
Y1 - 1992
N2 - In this paper we propose a hierarchical deformation model to describe the deformation of cursive Chinese characters for on-line character recognition. The new approach consists of two levels of match processes. First, the attributed string editing algorithm determines the stroke correspondence between the input and the reference patters. Next, the constrained parabola transformation is used to reduce the difference between the matched strokes appropriately. Experimental results show that our hierarchical deformation model provides a robust distance measure between patterns, and obtains a quite accurate approximation to the deformation of cursive Chinese characters with much lower computational cost.
AB - In this paper we propose a hierarchical deformation model to describe the deformation of cursive Chinese characters for on-line character recognition. The new approach consists of two levels of match processes. First, the attributed string editing algorithm determines the stroke correspondence between the input and the reference patters. Next, the constrained parabola transformation is used to reduce the difference between the matched strokes appropriately. Experimental results show that our hierarchical deformation model provides a robust distance measure between patterns, and obtains a quite accurate approximation to the deformation of cursive Chinese characters with much lower computational cost.
UR - http://www.scopus.com/inward/record.url?scp=0042459802&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0042459802&partnerID=8YFLogxK
U2 - 10.1109/ICPR.1992.201753
DO - 10.1109/ICPR.1992.201753
M3 - Conference contribution
AN - SCOPUS:0042459802
SN - 0818629150
T3 - Proceedings - International Conference on Pattern Recognition
SP - 195
EP - 199
BT - Conference B
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 11th IAPR International Conference on Pattern Recognition, IAPR 1992
Y2 - 30 August 1992 through 3 September 1992
ER -