A comprehensive study of inversion current in MOS tunneling diodes

C. H. Lin, B. C. Hsu, M. H. Lee, C. W. Liu

研究成果: 雜誌貢獻文章同行評審

31 引文 斯高帕斯(Scopus)

指紋 深入研究「A comprehensive study of inversion current in MOS tunneling diodes」主題。共同形成了獨特的指紋。

Chemical Compounds

Engineering & Materials Science