搜尋結果
Lee, M. H. ,
Chang, S. T. ,
Lee, S. W. ,
Chen, P. S. ,
Shen, K. W. &
Wang, W. C. ,
2008 7月 30 ,
於: Applied Surface Science. 254 ,
19 ,
p. 6147-6150 4 p. 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
field effect transistors
100%
Carbon
96%
engineering
94%
carbon
84%
Carbon Atom
59%
Liu, C. W. ,
Hsu, B. C. ,
Chen, K. F. ,
Lee, M. H. ,
Shie, C. R. &
Chen, P. S. ,
2003 1月 27 ,
於: Applied Physics Letters. 82 ,
4 ,
p. 589-591 3 p. 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
liquid phases
100%
caps
62%
metal oxide semiconductors
60%
deposits
53%
photometers
52%
Shear Stress
100%
stress distribution
77%
Dielectric Material
73%
Stress concentration
71%
finite element method
69%
Lee, M. H. ,
Chang, S. T. ,
Peng, C. Y. ,
Hsieh, B. F. ,
Maikap, S. &
Liao, S. H. ,
2008 11月 3 ,
於: Thin Solid Films. 517 ,
1 ,
p. 105-109 5 p. 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
field effect transistors
100%
Carbon
96%
Scattering
90%
carbon
84%
Carbon Atom
59%
Liu, C. W. ,
Chen, M. J. ,
Lin, I. C. ,
Lee, M. H. &
Lin, C. F. ,
2000 8月 21 ,
於: Applied Physics Letters. 77 ,
8 ,
p. 1111-1113 3 p. 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
electroluminescence
100%
metal oxides
95%
diodes
74%
temperature dependence
63%
room temperature
55%
Liao, M. H. ,
Huang, H. Y. ,
Tsai, F. A. ,
Chuang, C. C. ,
Hsu, M. H. ,
Lee, C. C. ,
Lee, M. H. ,
Lien, C. ,
Hsieh, C. F. ,
Wu, T. C. ,
Wu, H. S. &
Yao, C. W. ,
2017 6月 1 ,
於: Vacuum. 140 ,
p. 63-65 3 p. 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
fins
100%
Field effect transistors
89%
Field Effect
82%
Capacitance
71%
capacitance
66%
Liao, M. H. ,
Huang, K. C. ,
Su, W. J. ,
Chen, S. C. &
Lee, M. H. ,
2020 1月 ,
於: IEEE Transactions on Electron Devices. 67 ,
1 ,
p. 406-408 3 p. , 8906168.
研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
Thermoelectricity
100%
Demonstrations
73%
Seebeck coefficient
20%
Seebeck Coefficient
16%
Figure of Merit
14%
Liao, M. H. ,
Lu, P. Y. ,
Su, W. J. ,
Chen, S. C. ,
Hung, H. T. ,
Kao, C. R. ,
Pu, W. C. ,
Chen, C. C. A. &
Lee, M. H. ,
2020 5月 ,
於: IEEE Transactions on Electron Devices. 67 ,
5 ,
p. 2205-2207 3 p. , 9042868.
研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
Carbon nanotubes
100%
Integrated circuits
87%
Demonstrations
77%
Carbon Nanotube
68%
Resistance
59%
Lien, C. ,
Hsieh, C. F. ,
Wu, H. S. ,
Wu, T. C. ,
Wei, S. J. ,
Chu, Y. H. ,
Liao, M. H. &
Lee, M. H. ,
2018 11月 ,
於: IEEE Transactions on Electron Devices. 65 ,
11 ,
p. 4834-4838 5 p. , 8466023.
研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
Capacitor
100%
Permittivity
97%
Multilayers
94%
Dielectric Constant
89%
Multilayer
86%
Yen, C. M. ,
Chang, S. Y. ,
Chen, K. C. ,
Feng, Y. J. ,
Chen, L. H. ,
Liao, B. Z. ,
Lee, M. H. ,
Chen, S. C. &
Liao, M. H. ,
2022 3月 1 ,
於: IEEE Transactions on Electron Devices. 69 ,
3 ,
p. 1600-1603 4 p. 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
Carbon nanotubes
100%
Demonstrations
77%
Silicon
74%
Carbon Nanotube
68%
Chemical mechanical polishing
30%
Lin, H. Y. ,
Basu, N. ,
Chen, S. C. ,
Lee, M. H. &
Liao, M. H. ,
2022 12月 5 ,
於: Applied Physics Letters. 121 ,
23 , 232101.
研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
tubes
100%
carbon
93%
silicon
75%
inserts
31%
titanium
23%
Liao, M. H. ,
Wu, C. C. ,
Su, W. J. ,
Chen, S. C. &
Lee, M. H. ,
2019 10月 ,
於: IEEE Transactions on Electron Devices. 66 ,
10 ,
p. 4478-4480 3 p. , 8818614.
研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
Nanogenerators
100%
Electron-Hole Recombination
88%
Spin Coating
71%
Dielectric Material
60%
Dynamic models
55%
Polysilicon
100%
Grain Boundary
89%
field effect transistors
68%
Trap Density Measurement
65%
Fabrication
64%
Lee, M. H. ,
Chang, S. T. ,
Lee, C. C. ,
Huang, J. J. ,
Hu, G. R. &
Huang, Y. S. ,
2010 1月 1 ,
於: Thin Solid Films. 518 ,
6 SUPPL. 1 ,
p. S246-S249 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
Nanocrystalline silicon
100%
Density of State
57%
Substrates
37%
Strain
37%
Flexible electronics
37%
Lien, C. ,
Hsieh, C. F. ,
Wu, T. C. ,
Yang, C. S. ,
Lee, M. H. ,
Xu, J. J. ,
Hu, C. W. ,
Huang, C. ,
Chang, S. Z. &
Liao, M. H. ,
2020 8月 ,
於: IEEE Transactions on Electron Devices. 67 ,
8 ,
p. 3417-3423 7 p. , 9112658.
研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
Leakage Current
100%
Leakage currents
81%
Capacitor
77%
Capacitors
60%
Permittivity
42%
Chen, K. C. ,
Basu, N. ,
Chen, S. C. ,
Lee, M. H. &
Liao, M. H. ,
2022 9月 1 ,
於: IEEE Transactions on Electron Devices. 69 ,
9 ,
p. 5386-5390 5 p. 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
Skin Effect
100%
Multilayer
99%
Silicon
87%
Carbon
84%
Carbon Nanotube
81%
Laser Annealing
100%
Excimer lasers
86%
laser annealing
67%
Excimer
60%
excimer lasers
55%
Yeo, C. C. ,
Cho, B. J. ,
Lee, M. H. ,
Liu, C. W. ,
Choi, K. J. &
Lee, T. W. ,
2006 5月 1 ,
於: Semiconductor Science and Technology. 21 ,
5 ,
p. 665-669 5 p. 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
Gate dielectrics
100%
caps
74%
Thermodynamic stability
72%
Annealing
69%
Dielectric Material
61%
Lee, M. H. ,
Chang, S. T. ,
Maikap, S. &
Huang, C. F. ,
2008 10月 ,
於: Solid-State Electronics. 52 ,
10 ,
p. 1569-1572 4 p. 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
Carrier mobility
100%
Carbon
76%
carbon
67%
Lattice mismatch
60%
Electron mobility
52%
Lee, M. H. ,
Chen, K. F. ,
Lai, C. C. ,
Liu, C. W. ,
Pai, W. W. ,
Chen, M. J. &
Lin, C. F. ,
2002 3月 15 ,
於: Japanese Journal of Applied Physics, Part 2: Letters. 41 ,
3 B ,
p. L326-L328 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
Light emission
100%
Silicon oxides
93%
high vacuum
69%
Light emitting diodes
63%
metal oxides
61%
Liao, M. H. ,
Huang, K. C. ,
Tsai, F. A. ,
Liu, C. Y. ,
Lien, C. &
Lee, M. H. ,
2018 1月 1 ,
於: AIP Advances. 8 ,
1 , 015020.
研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
bismuth tellurides
100%
electric power
90%
electrical resistivity
53%
thin films
35%
film thickness
22%
Hua, W. C. ,
Lee, M. H. ,
Chen, P. S. ,
Tsai, M. J. &
Liu, C. W. ,
2005 9月 ,
於: IEEE Electron Device Letters. 26 ,
9 ,
p. 667-669 3 p. 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
Threading Dislocation
100%
Field Effect
17%
Voltage
12%
Power spectral density
8%
Field effect transistors
8%
Chen, P. S. ,
Lee, S. W. ,
Liu, Y. H. ,
Lee, M. H. ,
Tsai, M. J. &
Liu, C. W. ,
2005 2月 ,
於: Materials Science in Semiconductor Processing. 8 ,
1-3 SPEC. ISS. ,
p. 15-19 5 p. 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
Ultrahigh vacuum
100%
Chemical vapor deposition
74%
Secondary Ion Mass Spectroscopy
69%
Ethylene
66%
ultrahigh vacuum
63%
Cheng, S. Y. ,
Lee, M. H. ,
Chang, S. T. ,
Lin, C. Y. ,
Chen, K. T. &
Hsieh, B. F. ,
2013 10月 1 ,
於: Thin Solid Films. 544 ,
p. 487-490 4 p. 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
Hole mobility
100%
Hole Mobility
71%
Oxide semiconductors
71%
MOSFET devices
70%
hole mobility
68%
Hsiang, K. Y. ,
Liao, C. Y. ,
Wang, J. F. ,
Lou, Z. F. ,
Lin, C. Y. ,
Chiang, S. H. ,
Liu, C. W. ,
Hou, T. H. &
Lee, M. H. ,
2021 10月 ,
於: Nanomaterials. 11 ,
10 , 2685.
研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
Antiferroelectric Material
100%
Ferroelectric materials
66%
Crystalline materials
52%
Diodes
46%
Polarization
37%
Chang, S. J. ,
Teng, C. Y. ,
Lin, Y. J. ,
Wu, T. M. ,
Lee, M. H. ,
Lin, B. H. ,
Tang, M. T. ,
Wu, T. S. ,
Hu, C. ,
Tang, E. Y. T. &
Tseng, Y. C. ,
2021 6月 23 ,
於: ACS Applied Materials and Interfaces. 13 ,
24 ,
p. 29212-29221 10 p. 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
Semiconductors
100%
Ferroelectric materials
92%
Oxides
84%
X-Ray Absorption Spectroscopy
68%
X rays
63%
朱冠宇 ,
劉謙 ,
魏永泰 ,
林哲群 &
李敏鴻 ,
2015 ,
於: 國家奈米元件實驗室奈米通訊. 22 ,
1 ,
p. 8-12 5 p. 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
李敏鴻 ,
陳冠任 ,
沈正都 &
羅廣禮 ,
2011 ,
於: 國家奈米元件實驗室奈米通訊. 18 ,
1 ,
p. 24-29 6 p. 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審