• 1849 引文
  • 25 h-指數
19982020

每年研究成果

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指紋 查看啟用 Min-Hung Lee 的研究主題。這些主題標籤來自此人的作品。共同形成了獨特的指紋。

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研究成果

Correlation between ferroelectricity and nitrogen incorporation of undoped hafnium dioxide thin films

Luo, J. D., Yeh, Y. T., Lai, Y. Y., Wu, C. F., Chung, H. T., Li, Y. S., Chuang, K. C., Li, W. S., Chen, P. G., Lee, M. H. & Cheng, H. C., 2020 六月, 於 : Vacuum. 176, 109317.

研究成果: 雜誌貢獻文章

  • Double Layers Omega FETs with Ferroelectric HfZrO2 for One-Transistor Memory

    Chen, K. T., Lo, C., Lin, Y. Y., Chueh, C. Y., Chang, C., Siang, G. Y., Tseng, Y. Y., Yang, Y. J., Hsieh, F. C., Chang, S. H., Liang, H., Chiang, S. H., Liu, J. H., Lin, Y. Y., Yeh, P. C., Wang, C. Y., Yang, H. Y., Tzeng, P. J., Liao, M. H., Chang, S. T. 及其他2, Tseng, Y. Y. & Lee, M. H., 2020 四月, 2020 IEEE International Reliability Physics Symposium, IRPS 2020 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 9129088. (IEEE International Reliability Physics Symposium Proceedings; 卷 2020-April).

    研究成果: 書貢獻/報告類型會議貢獻

  • The Demonstration of 3-D Bi2.0Te2.7Se0.3/Bi0.4Te3.0Sb1.6 Thermoelectric Devices by Ionized Sputter System

    Liao, M. H., Huang, K. C., Su, W. J., Chen, S. C. & Lee, M. H., 2020 一月, 於 : IEEE Transactions on Electron Devices. 67, 1, p. 406-408 3 p., 8906168.

    研究成果: 雜誌貢獻文章

  • The demonstration of carbon nanotubes (CNTs) as flip-chip connections in 3-D integrated circuits with an ultralow connection resistance

    Liao, M. H., Lu, P. Y., Su, W. J., Chen, S. C., Hung, H. T., Kao, C. R., Pu, W. C., Chen, C. C. A. & Lee, M. H., 2020 五月, 於 : IEEE Transactions on Electron Devices. 67, 5, p. 2205-2207 3 p., 9042868.

    研究成果: 雜誌貢獻文章

  • 3D Scalable, Wake-up Free, and Highly Reliable FRAM Technology with Stress-Engineered HfZrOx

    Lin, Y. D., Tang, Y. T., Sheu, S. S., Hou, T. H., Lo, W. C., Lee, M. H., Chang, M. F., King, Y. C., Lin, C. J., Lee, H. Y., Yeh, P. C., Yang, H. Y., Yeh, P. S., Wang, C. Y., Su, J. W. & Li, S. H., 2019 十二月, 2019 IEEE International Electron Devices Meeting, IEDM 2019. Institute of Electrical and Electronics Engineers Inc., 8993504. (Technical Digest - International Electron Devices Meeting, IEDM; 卷 2019-December).

    研究成果: 書貢獻/報告類型會議貢獻