• 633 引文
  • 14 h-指數
19972019

每年研究成果

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研究成果

2013

Si-capping thicknesses impacting compressive strained MOSFETs with temperature effect

Wang, M. C., Peng, S. H., Wang, S. J., Yang, H. C., Liao, W. S., Li, C. W. & Liu, C. H., 2013 五月 27, ISNE 2013 - IEEE International Symposium on Next-Generation Electronics 2013. p. 361-364 4 p. 6512367

研究成果: 書貢獻/報告類型會議貢獻

Strained pMOSFETs with SiGe channel and embedded SiGe source/drain stressor under heating and hot-carrier stresses

Wang, M. C., Peng, M. R., Ji, L. R., Huang, H. S., Chen, S. Y., Wang, S. J., Hsu, H. W., Liao, W. S. & Liu, C-H., 2013 五月 27, p. 371-374. 4 p.

研究成果: 會議貢獻類型

1 引文 斯高帕斯(Scopus)

Temperature-dependent current conduction of metal-ferroelectric (BiFeO 3)-insulator (ZrO2)-Silicon capacitors for nonvolatile memory applications

Juan, P. C., Lin, C. L., Liu, C. H., Chen, C. H., Chang, Y. K. & Yeh, L. Y., 2013 七月 31, 於 : Thin Solid Films. 539, p. 360-364 5 p.

研究成果: 雜誌貢獻文章

5 引文 斯高帕斯(Scopus)

The analysis of the process-induced channel stress in N-MOSFET

Twu, M-J., Deng, R. H., Chen, Z. H., Tsai, M. C., Lin, K. C. & Liu, C-H., 2013 七月 8, Materials Science and Chemical Engineering. p. 440-444 5 p. (Advanced Materials Research; 卷 699).

研究成果: 書貢獻/報告類型會議貢獻

The effect of ternary material (Zr, Y, and O) high-k gate dielectrics

Lin, K. C., Chou, C. H., Chen, J. Y., Li, C. J., Huang, J. Y. & Liu, C-H., 2013 七月 8, Materials Science and Chemical Engineering. p. 422-425 4 p. (Advanced Materials Research; 卷 699).

研究成果: 書貢獻/報告類型會議貢獻

1 引文 斯高帕斯(Scopus)

The effect of ZrN antidiffusion capping layer on the electrical and physical properties of metal-gate/ZrN/Zr-graded Dy2O3/Si MIS nanolaminated structures

Juan, P. C., Liu, C. H., Lin, C. L., Mong, F. C. & Huang, J. H., 2013 四月 30, 於 : Microelectronic Engineering. 109, p. 172-176 5 p.

研究成果: 雜誌貢獻文章

1 引文 斯高帕斯(Scopus)

The enhancement of MOSFET electric performance through strain engineering by refilled sige as Source and Drain

Yang, H. C., Li, C. W., Liao, W. S., Du, C. K., Wang, M. C., Yang, J. M., Lian, C. W. & Liu, C-H., 2013 三月 13, Proceedings of the 2013 IEEE 5th International Nanoelectronics Conference, INEC 2013. p. 251-253 3 p. 6466014. (Proceedings - Winter Simulation Conference).

研究成果: 書貢獻/報告類型會議貢獻

1 引文 斯高帕斯(Scopus)

The simulation analysis of MOSFET channel stress for different oxide/nitride/oxide (ONO) spacer thicknesses

Chen, J. Y., Chen, Z. H., Lin, K. C., Twu, M-J., Hung, Y. H., Chou, P. Y., Chen, G. T., Liu, Y. S. & Liu, C-H., 2013 七月 8, Materials Science and Chemical Engineering. p. 436-439 4 p. (Advanced Materials Research; 卷 699).

研究成果: 書貢獻/報告類型會議貢獻

Trend of subthreshold swing with DPN process for 28nm N/PMOSFETs

Wang, M. C., Du, C. K., Peng, M. R., Wang, S. J., Chen, S. Y., Liu, C-H., Cheng, O., Huang, L. S. & Lee, S. C., 2013 五月 27, p. 389-392. 4 p.

研究成果: 會議貢獻類型

3 引文 斯高帕斯(Scopus)
2012

Adaptive Fuzzy Cerebellar Model Articulation Controller for two-wheeled robot

Chen, J. Y., Lin, K. C., Tsai, P. S., Liu, C-H. & Ouyang, J. M., 2012 四月 4, 於 : Advanced Materials Research. 482-484, p. 1025-1036 12 p.

研究成果: 雜誌貢獻Conference article

A study of characteristics of halogen-free prevented solder materials

Wang, M. C., Shih, T. T., Lin, B. Y., Yang, H. C., Wu, Y. D. & Liu, C-H., 2012 十二月 1, ICEPT-HDP 2012 Proceedings - 2012 13th International Conference on Electronic Packaging Technology and High Density Packaging. p. 101-104 4 p. 6474579. (ICEPT-HDP 2012 Proceedings - 2012 13th International Conference on Electronic Packaging Technology and High Density Packaging).

研究成果: 書貢獻/報告類型會議貢獻

Electron detrapping in thin hafnium silicate and nitrided hafnium silicate gate dielectric stacks

Huang, H. S., Samanta, P., Tzeng, T. J., Chen, S. Y. & Liu, C. H., 2012 一月 9, 於 : Applied Physics Letters. 100, 2, 023501.

研究成果: 雜誌貢獻文章

5 引文 斯高帕斯(Scopus)

Leakage current conduction behaviors of 0.65 nm equivalent-oxide-thickness HfZrLaO gate dielectrics

Lin, K. C., Chen, J. Y., Hsu, H. W., Chen, H. W. & Liu, C-H., 2012 十一月 1, 於 : Solid-State Electronics. 77, p. 7-11 5 p.

研究成果: 雜誌貢獻文章

11 引文 斯高帕斯(Scopus)

ONO側壁與CESL對MOSFET通道應力影響之分析

楊煌偉(Huang-Wei Y, 鄧榮皓(Rong-Hou D, 蔡旻琦(Ming-Chi T, 屠名正(Ming-Jenq T & 劉傳璽(Chuan-Hsi L, 2012, 於 : 真空科技. 25, 3, p. 22-27 6 p.

研究成果: 雜誌貢獻文章

Reliability characteristics of metal-oxide-semiconductor capacitors with 0.72 nm equivalent-oxide-thickness LaO/HfO2 stacked gate dielectrics

Liu, C-H., Hsu, H. W., Chen, H. W., Juan, P. C., Wang, M. C., Cheng, C-P. & Huang, H. S., 2012 一月 1, 於 : Microelectronic Engineering. 89, 1, p. 15-18 4 p.

研究成果: 雜誌貢獻文章

4 引文 斯高帕斯(Scopus)

The effect of lanthanum (La) incorporation in ultra-thin ZrO2 high-κ gate dielectrics

Liu, C. H., Juan, P. C., Chou, Y. H. & Hsu, H. W., 2012 一月 1, 於 : Microelectronic Engineering. 89, 1, p. 2-5 4 p.

研究成果: 雜誌貢獻文章

6 引文 斯高帕斯(Scopus)

Time dependent dielectric breakdown (TDDB) characteristics of metal-oxide-semiconductor capacitors with HfLaO and HfZrLaO ultra-thin gate dielectrics

Hsu, H. W., Huang, H. S., Chen, H. W., Cheng, C-P., Lin, K. C., Chen, S. Y., Wang, M. C. & Liu, C-H., 2012 十一月 1, 於 : Solid-State Electronics. 77, p. 2-6 5 p.

研究成果: 雜誌貢獻文章

3 引文 斯高帕斯(Scopus)
2011

Adaptive fuzzy control of two-wheeled balancing vehicle

Chen, J. Y., Liu, C. H., Chen, C. C. & Lin, K. C., 2011 十二月 1, Proceedings - 2011 International Conference on Instrumentation, Measurement, Computer, Communication and Control, IMCCC 2011. p. 341-344 4 p. 6154070. (Proceedings - 2011 International Conference on Instrumentation, Measurement, Computer, Communication and Control, IMCCC 2011).

研究成果: 書貢獻/報告類型會議貢獻

Current conduction mechanisms of 0.65 nm equivalent oxide thickness HfZrLaO thin films

Chen, H. W., Hsu, H. W., Chen, S. Y., Huang, H. S., Wang, M. C. & Liu, C. H., 2011 九月 26, 4th IEEE International NanoElectronics Conference, INEC 2011. 5991686. (Proceedings - International NanoElectronics Conference, INEC).

研究成果: 書貢獻/報告類型會議貢獻

1 引文 斯高帕斯(Scopus)

Influence of la substitution on the electrical properties of metal-ferroelectric (BiFeO3)-insulator (CeO2)- semiconductor nonvolatile memory structures

Juan, P. C., Hsu, C. W., Liu, C. H., Wang, M. T. & Yeh, L. Y., 2011 七月 1, 於 : Microelectronic Engineering. 88, 7, p. 1217-1220 4 p.

研究成果: 雜誌貢獻文章

4 引文 斯高帕斯(Scopus)

Motion estimation using two-stage predictive search algorithms based on joint spatio-temporal correlation information

Hsieh, L., Chen, W. S. & Liu, C. H., 2011 九月, 於 : Expert Systems with Applications. 38, 9, p. 11608-11623 16 p.

研究成果: 雜誌貢獻文章

13 引文 斯高帕斯(Scopus)

SOP package surface discoloration after PCT test

Wang, M. C., Yang, H. C., Liu, C-H. & Yang, R. H., 2011 十一月 22, ICEPT-HDP 2011 Proceedings - 2011 International Conference on Electronic Packaging Technology and High Density Packaging. p. 855-858 4 p. 6066964

研究成果: 書貢獻/報告類型會議貢獻

1 引文 斯高帕斯(Scopus)

The influence of physical and electrical properties in HfO2 thin film with different lanthanum doping position

Juan, P. C., Chien, Y. S., Lin, J. Y., Cheng, C. P., Liu, C. H., Hsu, H. W., Chen, H. W. & Huang, H. S., 2011 九月 26, 4th IEEE International NanoElectronics Conference, INEC 2011. 5991692. (Proceedings - International NanoElectronics Conference, INEC).

研究成果: 書貢獻/報告類型會議貢獻

The study of integrating PDA mobile learning device into the Arts and Humanities Learning Curriculum for elementary schools-mobile digital learning space

Chao, J., Lu, Y. H., Tzeng, Y. D. & Liu, C. H., 2011 九月 23, 2011 International Conference on Multimedia Technology, ICMT 2011. p. 6119-6124 6 p. 6001904

研究成果: 書貢獻/報告類型會議貢獻

1 引文 斯高帕斯(Scopus)

Time dependent dielectric breakdown (TDDB) characteristics of metal-oxide-semiconductor capacitors with HfLaO and HfZrLaO ultra-thin gate dielectrics

Liu, C-H., Chen, Y. L., Cheng, C-P., Chen, H. W., Hsu, H. W., Chen, S. Y., Huang, H. S. & Wang, M. C., 2011 九月 26, 4th IEEE International NanoElectronics Conference, INEC 2011. 5991693. (Proceedings - International NanoElectronics Conference, INEC).

研究成果: 書貢獻/報告類型會議貢獻

2010

A genome-wide quantitative trait loci scan of neurocognitive performances in families with schizophrenia

Lien, Y. J., Liu, C. M., Faraone, S. V., Tsuang, M. T., Hwu, H. G., Hsiao, P. C. & Chen, W. J., 2010 十月 1, 於 : Genes, Brain and Behavior. 9, 7, p. 695-702 8 p.

研究成果: 雜誌貢獻文章

17 引文 斯高帕斯(Scopus)

Ameliorated particle swarm optimization by integrating Taguchi methods

Liu, C-H., Chen, Y. L. & Chen, J. Y., 2010 十一月 15, 2010 International Conference on Machine Learning and Cybernetics, ICMLC 2010. p. 1823-1828 6 p. 5580960. (2010 International Conference on Machine Learning and Cybernetics, ICMLC 2010; 卷 4).

研究成果: 書貢獻/報告類型會議貢獻

2 引文 斯高帕斯(Scopus)

An adaptive PID controller

Chen, J. Y., Liu, C. H., Fan, C. W., Shin, H. Y. & Yen, M. H., 2010 十一月 15, 2010 International Conference on Machine Learning and Cybernetics, ICMLC 2010. p. 884-889 6 p. 5580596. (2010 International Conference on Machine Learning and Cybernetics, ICMLC 2010; 卷 2).

研究成果: 書貢獻/報告類型會議貢獻

2 引文 斯高帕斯(Scopus)

A study to performance of electroplating solder bump in assembly

Wang, M. C., Huang, K. S., Hsieh, Z. Y., Yang, H. C., Liu, C-H. & Lin, C. R., 2010 十一月 24, Proceedings - 2010 11th International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP 2010. p. 794-797 4 p. 5582692. (Proceedings - 2010 11th International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP 2010).

研究成果: 書貢獻/報告類型會議貢獻

2 引文 斯高帕斯(Scopus)

Depth profiles and chemical bonding states of graded doping and ultra-thin HfLaO high-k dielectrics deposited on silicon substrate

Juan, P. C., Liu, C-H., Jou, M., Chen, Y. K., Liu, Y. W., Hsu, C. W., Chou, Y. H. & Lin, J. Y., 2010 五月 5, INEC 2010 - 2010 3rd International Nanoelectronics Conference, Proceedings. p. 672-673 2 p. 5424647. (INEC 2010 - 2010 3rd International Nanoelectronics Conference, Proceedings).

研究成果: 書貢獻/報告類型會議貢獻

Efficiency improvement of organic light emitting diodes with co-deposited hole blocking layer

Liu, C. H., Tseng, C. H. & Cheng, C. P., 2010 一月 1, Diffusion in Solids and Liquids V. Trans Tech Publications Ltd, 卷 297-301. p. 561-566 6 p.

研究成果: 書貢獻/報告類型會議貢獻

Efficiency of dispenser with nozzle technology in assembly

Wang, M. C., Huang, K. S., Chen, S. Y., Hsieh, Z. Y., Yang, H. C., Liu, C-H. & Lin, C. R., 2010 十一月 24, Proceedings - 2010 11th International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP 2010. p. 476-479 4 p. 5583781. (Proceedings - 2010 11th International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP 2010).

研究成果: 書貢獻/報告類型會議貢獻

7 引文 斯高帕斯(Scopus)

Impact of Hf content on positive bias temperature instability reliability of HfSiON gate dielectrics

Chen, H. W. & Liu, C-H., 2010 五月 1, 於 : Microelectronics Reliability. 50, 5, p. 614-617 4 p.

研究成果: 雜誌貢獻文章

7 引文 斯高帕斯(Scopus)

Influences of dye doping and hole blocking layer insertion on OLED performance

Tesng, C. H., Liu, C. H. & Cheng, C. P., 2010 一月 1, Diffusion in Solids and Liquids V. Trans Tech Publications Ltd, 卷 297-301. p. 555-560 6 p.

研究成果: 書貢獻/報告類型會議貢獻

Performance of silver-glue attachment technology in assembly

Wang, M. C., Huang, K. S., Hsieh, Z. Y., Yang, H. C., Liu, C. H. & Lin, C. R., 2010 十一月 24, Proceedings - 2010 11th International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP 2010. p. 472-475 4 p. 5583797. (Proceedings - 2010 11th International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP 2010).

研究成果: 書貢獻/報告類型會議貢獻

Promoting of charged-device model/electrostatic discharge immunity in the dicing saw process

Wang, M. C., Liu, C-H., Huang, K. S., Hsieh, Z. Y., Chen, S. Y., Yang, H. C. & Lin, C. R., 2010 六月 1, 於 : Microelectronics Reliability. 50, 6, p. 839-846 8 p.

研究成果: 雜誌貢獻文章

Structural properties of ultra-thin Y2O3 gate dielectrics studied by X-Ray Diffraction (XRD) and X-Ray Photoelectron Spectroscopy (XPS)

Liu, C. H., Juan, P. C., Cheng, C. P., Lai, G. T., Lee, H., Chen, Y. K., Liu, Y. W. & Hsu, C. W., 2010 五月 5, INEC 2010 - 2010 3rd International Nanoelectronics Conference, Proceedings. p. 1256-1257 2 p. 5424914. (INEC 2010 - 2010 3rd International Nanoelectronics Conference, Proceedings).

研究成果: 書貢獻/報告類型會議貢獻

2 引文 斯高帕斯(Scopus)

Substrate current verifying lateral electrical field under forward substrate biases for nMOSFETs

Huang, H. S., Wang, M. C., Hsieh, Z. Y., Chen, S. Y., Chuang, A. E. & Liu, C-H., 2010 五月 1, 於 : Solid-State Electronics. 54, 5, p. 527-529 3 p.

研究成果: 雜誌貢獻文章

2 引文 斯高帕斯(Scopus)

The influence of lanthanum doping position in ultra-thin HfO2 films for high-k gate dielectrics

Liu, C-H., Juan, P. C. & Lin, J. Y., 2010 十月 1, 於 : Thin Solid Films. 518, 24, p. 7455-7459 5 p.

研究成果: 雜誌貢獻文章

16 引文 斯高帕斯(Scopus)
9 引文 斯高帕斯(Scopus)
2009

Analysis of promising copper wire bonding in assembly consideration

Wang, M. C., Hsieh, Z. Y., Huang, K. S., Liu, C. H. & Lin, C. R., 2009, IMPACT Conference 2009 International 3D IC Conference - Proceedings. p. 108-111 4 p. 5382168

研究成果: 書貢獻/報告類型會議貢獻

4 引文 斯高帕斯(Scopus)

Current conduction of 0.72 nm equivalent-oxide-thickness LaO/HfO 2 stacked gate dielectrics

Liu, C. H., Chen, H. W., Chen, S. Y., Huang, H. S. & Cheng, L. W., 2009 七月 20, 於 : Applied Physics Letters. 95, 1, 012103.

研究成果: 雜誌貢獻文章

34 引文 斯高帕斯(Scopus)

Electrical characterization and dielectric properties of metal-oxide-semiconductor structures using high-K CeZrO4 ternary oxide as gate dielectric

Juan, P. C., Liu, C-H., Lin, C. L., Ju, S. C., Chen, M. G., Chanf, I. Y. K. & Lu, J. H., 2009 五月 1, 於 : Japanese Journal of Applied Physics. 48, 5 PART 2

研究成果: 雜誌貢獻文章

11 引文 斯高帕斯(Scopus)

National project on 45 to 32 nm metal oxide semiconductor field effect transistors for next century IC fabrications

Hwang, H. L., Wang, C. W., Chang, K. H., Tsai, C. H., Leou, K. C., Chang-Liao, K. S., Lu, C. C., Chang, S. C., Liu, C. H., Chin, A., Chang, K. M. & Chen, B. N., 2009 四月 4, 於 : e-Journal of Surface Science and Nanotechnology. 7, p. 507-512 6 p.

研究成果: 雜誌貢獻文章

Optimization of solderability for 2.4GHz RF printed-circuit-board products

Wang, M. C., Yang, T. Y., Hsieh, Z. Y., Yang, H. C., Liu, C. H. & Lin, C. R., 2009 十二月 1, IMPACT Conference 2009 International 3D IC Conference - Proceedings. p. 227-230 4 p. 5382133

研究成果: 書貢獻/報告類型會議貢獻

5 引文 斯高帕斯(Scopus)
2008

Electrical and reliability characteristics in strained-Si mOSFETs

Yang, C. C., Pan, T. M., Chen, K. M. & Liu, C. H., 2008 十一月 17, ECS Transactions - Dielectrics for Nanosystems 3: Materials Science, Processing, Reliability, and Manufacturing. 2 編輯 p. 271-277 7 p. (ECS Transactions; 卷 13, 編號 2).

研究成果: 書貢獻/報告類型會議貢獻