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查看斯高帕斯 (Scopus) 概要
吳 謙讓
之前聯繫機構
光電工程學士學位學程
https://orcid.org/0000-0002-3215-7227
h-index
h10-index
2916
引文
28
h-指數
按照存儲在普爾（Pure）的出版物數量及斯高帕斯（Scopus）引文計算。
260
引文
8
h-指數
按照存儲在普爾（Pure）的出版物數量及斯高帕斯（Scopus）引文計算。
1996
2018
每年研究成果
概覽
指紋
網路
研究成果
(168)
類似的個人檔案
(3)
指紋
查看啟用 Chien-Jang Wu 的研究主題。這些主題標籤來自此人的作品。共同形成了獨特的指紋。
排序方式
重量
按字母排序
INIS
crystals
100%
layers
72%
dielectrics
54%
transmission
49%
defects
46%
filters
42%
surfaces
40%
superconductors
38%
microwave radiation
36%
thickness
34%
semiconductor materials
32%
peaks
31%
periodicity
26%
reflection
25%
one-dimensional calculations
25%
films
22%
plasmons
19%
ferroelectric materials
18%
design
17%
wavelengths
16%
optical properties
15%
investigations
15%
superconducting films
15%
impedance
15%
thin films
14%
polaritons
14%
permittivity
13%
metals
12%
plasma frequency
12%
transmission lines
12%
high temperature
11%
magnetic fields
11%
transfer matrix method
11%
losses
11%
incidents
11%
polarization
11%
doped materials
10%
mixed state
10%
spectra
10%
symmetry
10%
vortices
9%
angle of incidence
9%
plasma
9%
substrates
9%
asymmetry
9%
temperature dependence
9%
type-ii superconductors
8%
applications
8%
waveguides
8%
metamaterials
7%
Physics
Photonic Crystal
93%
Dielectrics
57%
Frequencies
54%
Microwave
37%
Photonics
37%
Semiconductor
32%
Gaps
27%
Temperature
21%
Ferroelectricity
20%
Region
18%
Responses
18%
Narrowband
17%
Magnetic Fields
16%
Impedance
15%
Optical Properties
15%
Transmittance
15%
Thin Films
14%
Eddy
12%
Reflectance
12%
Permittivity
11%
Plasma Frequencies
11%
Polariton
11%
Metal
11%
Transfer-Matrix Method
11%
Surface Plasmon
10%
Superconducting Film
10%
near Infrared
10%
Wave Property
10%
Quantum Wells
10%
Model
10%
Statics
10%
Substrates
9%
High Temperature
8%
Metamaterial
8%
Increasing
7%
Light
7%
Air
7%
Spectra
7%
Refractivity
7%
Film Thickness
6%
Microwave Transmission
6%
Attenuation
5%
Energy Gaps (Solid State)
5%
Value
5%
Arrays
5%
Crystals
5%
Calculation
5%
Electric Potential
5%
High Temperature Superconductors
5%
Mirrors
5%
Engineering
Photonics
24%
Filters
17%
Transmissions
15%
Defects
15%
Semiconductor
12%
Narrowband
8%
Dielectrics
8%
Microwave
6%
Thickness
6%
Surfaces
6%
Impedance
6%
Multichannel
5%
Filtration
5%
