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盧 志權
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物理學系
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ntnu.edu
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h-index
293
引文
10
h-指數
按照存儲在普爾（Pure）的出版物數量及斯高帕斯（Scopus）引文計算。
1996
2014
每年研究成果
概覽
指紋
網路
研究成果
(60)
類似的個人檔案
(1)
指紋
查看啟用 Chi-Kuen Lo 的研究主題。這些主題標籤來自此人的作品。共同形成了獨特的指紋。
排序方式
重量
按字母排序
INIS
layers
100%
films
89%
spin
55%
anisotropy
50%
magnetization
50%
transistors
50%
magnesium oxides
42%
permalloy
42%
epitaxy
41%
thickness
38%
magnetoresistance
37%
valves
35%
temperature range 0273-0400 k
34%
impedance
30%
electron beams
27%
buffers
26%
junctions
25%
annealing
23%
magnetic properties
22%
kerr effect
20%
hysteresis
20%
tunneling
19%
surfaces
18%
evaporation
17%
fcc lattices
16%
silicon
16%
ferromagnetic resonance
16%
shape
15%
mhz range
14%
substrates
14%
stability
13%
coercive force
13%
metals
12%
transport
12%
growth
12%
orientation
11%
nanostructures
11%
osmium
11%
hcp lattices
11%
glass
10%
barriers
10%
topography
9%
magnetic fields
9%
nickel oxides
9%
hall effect
9%
voltage
9%
symmetry
9%
peaks
8%
randomness
8%
performance
8%
Material Science
Film
77%
Magnesium Oxide
41%
Anisotropy
41%
Permalloy
29%
Buffer Layer
24%
Transistor
22%
Oxide Compound
19%
Magnetoresistance
17%
Magnetic Property
16%
Giant Magnetoresistance
15%
Molecular Beam Epitaxy
12%
Osmium
11%
Surface Topography
11%
Electronic Circuit
10%
Capacitance
9%
Surface (Surface Science)
9%
Reflection High-Energy Electron Diffraction
8%
Thermal Stability
8%
Oxide Film
8%
Lithography
8%
Annealing
7%
Cobalt
6%
Lattice Mismatch
6%
Dielectric Spectroscopy
6%
Domain Wall
5%
Silicon
5%
Magneto-Transport
5%
Permittivity
5%
Magnetic Thin Films
5%
Epitaxial Film
5%
Engineering
Room Temperature
29%
Epitaxial Film
16%
Optical Kerr effect
16%
X Ray Diffraction
11%
Electron Optical Lithography
11%
Current Collector
11%
Oxide Layer
11%
Spin Transistor
11%
Film Plane
11%
Coercivity
9%
Buffer Layer
8%
Random Access Memory
8%
Resistance Ratio
8%
Magnetic Moment
6%
Equivalent Circuit
6%
Imaginary Part
6%
High Resolution
5%
Axis Parallel
5%
Inductive Coupled Plasma
5%
Crystal Structure
5%
Low-Temperature
5%
Gas Pressure
5%
Surface Topography
5%
Mass Spectrum
5%
Field-Emission Scanning Electron Microscopy
5%
Mass Spectrometry
5%
Light Emission
5%
Oxygen Concentration
5%
Observed Data
5%
Edge Effect
5%
Q Factor
5%
Magnetic Domain
5%
Current Ratio
5%
Magnetocrystalline Anisotropy
5%
Temperature Stability
5%
Lattice Mismatch
5%
Magnetization Reversal
5%
Tunnel Construction
5%
Resonant Frequency
5%
Band Gap
5%
Thin Films
5%
Good Agreement
5%
Dependent Behavior
5%
Anisotropy Energy
5%
Current Line
5%
Electric Network Analysis
5%
Oxide Film
5%
Anisotropy Field
5%
Symmetric Part
5%
Crystalline Anisotropy
5%
