Using ensemble empirical mode decomposition to improve the static fringe analysis in optical testing

Yu Ta Chen; Mang Ou-Yang; Shuen-De Wu; Shiou Gwo Lin; Yi Ting Kuo; Cheng Chung Lee

doi:10.1109/I2MTC.2012.6229233

Using ensemble empirical mode decomposition to improve the static fringe analysis in optical testing

Yu Ta Chen, Mang Ou-Yang, Shuen-De Wu, Shiou Gwo Lin, Yi Ting Kuo, Cheng Chung Lee

Department of Mechatronic Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Static fringe analysis is an important skill to reconstruct the surface profile of the tested optics. The mixed image is simulated by the tilt aberration, and several methods of the reducing mixing fringe are utilized to reconstruct the optical paths difference (OPD) profile of the mixed image. In this paper, we propose the ensemble empirical mode decomposition (EEMD) method to decompose the mixed image into several intrinsic mode functions (IMFs), and then removing one or more IMFs to reduce the influence of the mixing fringe in the mixed image. The procedure of reducing mixing fringe can reconstruct the OPD profile of the mixed image easily. In the simulation, using EEMD to reduce the influence of the mixing fringe, the root mean square (RMS) value of the OPD is 0.081 waves as the residue image subtracted from the OPD profiles of original image. In the experiment, the EEMD method reducing the noise of the mixing fringe has the advantage on the high frequency as spherical aberration.

Original language	English
Title of host publication	2012 IEEE I2MTC - International Instrumentation and Measurement Technology Conference, Proceedings
Pages	249-253
Number of pages	5
DOIs	https://doi.org/10.1109/I2MTC.2012.6229233
Publication status	Published - 2012 Jul 30
Event	2012 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2012 - Graz, Austria Duration: 2012 May 13 → 2012 May 16

Other

Other	2012 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2012
Country	Austria
City	Graz
Period	12/5/13 → 12/5/16

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Keywords

ensemble empirical mode decomposition
optical testing
static fringe analysis

ASJC Scopus subject areas

Electrical and Electronic Engineering

Cite this

Chen, Y. T., Ou-Yang, M., Wu, S-D., Lin, S. G., Kuo, Y. T., & Lee, C. C. (2012). Using ensemble empirical mode decomposition to improve the static fringe analysis in optical testing. In 2012 IEEE I2MTC - International Instrumentation and Measurement Technology Conference, Proceedings (pp. 249-253). [6229233] https://doi.org/10.1109/I2MTC.2012.6229233

Using ensemble empirical mode decomposition to improve the static fringe analysis in optical testing. / Chen, Yu Ta; Ou-Yang, Mang; Wu, Shuen-De; Lin, Shiou Gwo; Kuo, Yi Ting; Lee, Cheng Chung.

2012 IEEE I2MTC - International Instrumentation and Measurement Technology Conference, Proceedings. 2012. p. 249-253 6229233.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Chen, YT, Ou-Yang, M, Wu, S-D, Lin, SG, Kuo, YT & Lee, CC 2012, Using ensemble empirical mode decomposition to improve the static fringe analysis in optical testing. in 2012 IEEE I2MTC - International Instrumentation and Measurement Technology Conference, Proceedings., 6229233, pp. 249-253, 2012 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2012, Graz, Austria, 12/5/13. https://doi.org/10.1109/I2MTC.2012.6229233

@inproceedings{74c7a3e048be44d6850047063ca9ffb0,

title = "Using ensemble empirical mode decomposition to improve the static fringe analysis in optical testing",

abstract = "Static fringe analysis is an important skill to reconstruct the surface profile of the tested optics. The mixed image is simulated by the tilt aberration, and several methods of the reducing mixing fringe are utilized to reconstruct the optical paths difference (OPD) profile of the mixed image. In this paper, we propose the ensemble empirical mode decomposition (EEMD) method to decompose the mixed image into several intrinsic mode functions (IMFs), and then removing one or more IMFs to reduce the influence of the mixing fringe in the mixed image. The procedure of reducing mixing fringe can reconstruct the OPD profile of the mixed image easily. In the simulation, using EEMD to reduce the influence of the mixing fringe, the root mean square (RMS) value of the OPD is 0.081 waves as the residue image subtracted from the OPD profiles of original image. In the experiment, the EEMD method reducing the noise of the mixing fringe has the advantage on the high frequency as spherical aberration.",

keywords = "ensemble empirical mode decomposition, optical testing, static fringe analysis",

author = "Chen, {Yu Ta} and Mang Ou-Yang and Shuen-De Wu and Lin, {Shiou Gwo} and Kuo, {Yi Ting} and Lee, {Cheng Chung}",

year = "2012",

month = jul

day = "30",

doi = "10.1109/I2MTC.2012.6229233",

language = "English",

isbn = "9781457717710",

pages = "249--253",

booktitle = "2012 IEEE I2MTC - International Instrumentation and Measurement Technology Conference, Proceedings",

note = "2012 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2012 ; Conference date: 13-05-2012 Through 16-05-2012",

}

TY - GEN

T1 - Using ensemble empirical mode decomposition to improve the static fringe analysis in optical testing

AU - Chen, Yu Ta

AU - Ou-Yang, Mang

AU - Wu, Shuen-De

AU - Lin, Shiou Gwo

AU - Kuo, Yi Ting

AU - Lee, Cheng Chung

PY - 2012/7/30

Y1 - 2012/7/30

N2 - Static fringe analysis is an important skill to reconstruct the surface profile of the tested optics. The mixed image is simulated by the tilt aberration, and several methods of the reducing mixing fringe are utilized to reconstruct the optical paths difference (OPD) profile of the mixed image. In this paper, we propose the ensemble empirical mode decomposition (EEMD) method to decompose the mixed image into several intrinsic mode functions (IMFs), and then removing one or more IMFs to reduce the influence of the mixing fringe in the mixed image. The procedure of reducing mixing fringe can reconstruct the OPD profile of the mixed image easily. In the simulation, using EEMD to reduce the influence of the mixing fringe, the root mean square (RMS) value of the OPD is 0.081 waves as the residue image subtracted from the OPD profiles of original image. In the experiment, the EEMD method reducing the noise of the mixing fringe has the advantage on the high frequency as spherical aberration.

AB - Static fringe analysis is an important skill to reconstruct the surface profile of the tested optics. The mixed image is simulated by the tilt aberration, and several methods of the reducing mixing fringe are utilized to reconstruct the optical paths difference (OPD) profile of the mixed image. In this paper, we propose the ensemble empirical mode decomposition (EEMD) method to decompose the mixed image into several intrinsic mode functions (IMFs), and then removing one or more IMFs to reduce the influence of the mixing fringe in the mixed image. The procedure of reducing mixing fringe can reconstruct the OPD profile of the mixed image easily. In the simulation, using EEMD to reduce the influence of the mixing fringe, the root mean square (RMS) value of the OPD is 0.081 waves as the residue image subtracted from the OPD profiles of original image. In the experiment, the EEMD method reducing the noise of the mixing fringe has the advantage on the high frequency as spherical aberration.

KW - ensemble empirical mode decomposition

KW - optical testing

KW - static fringe analysis

UR - http://www.scopus.com/inward/record.url?scp=84864214909&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84864214909&partnerID=8YFLogxK

U2 - 10.1109/I2MTC.2012.6229233

DO - 10.1109/I2MTC.2012.6229233

M3 - Conference contribution

AN - SCOPUS:84864214909

SN - 9781457717710

SP - 249

EP - 253

BT - 2012 IEEE I2MTC - International Instrumentation and Measurement Technology Conference, Proceedings

T2 - 2012 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2012

Y2 - 13 May 2012 through 16 May 2012

ER -

Access to Document

10.1109/I2MTC.2012.6229233