Using ensemble empirical mode decomposition to improve the static fringe analysis in optical testing

Yu Ta Chen, Mang Ou-Yang, Shuen-De Wu, Shiou Gwo Lin, Yi Ting Kuo, Cheng Chung Lee

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Static fringe analysis is an important skill to reconstruct the surface profile of the tested optics. The mixed image is simulated by the tilt aberration, and several methods of the reducing mixing fringe are utilized to reconstruct the optical paths difference (OPD) profile of the mixed image. In this paper, we propose the ensemble empirical mode decomposition (EEMD) method to decompose the mixed image into several intrinsic mode functions (IMFs), and then removing one or more IMFs to reduce the influence of the mixing fringe in the mixed image. The procedure of reducing mixing fringe can reconstruct the OPD profile of the mixed image easily. In the simulation, using EEMD to reduce the influence of the mixing fringe, the root mean square (RMS) value of the OPD is 0.081 waves as the residue image subtracted from the OPD profiles of original image. In the experiment, the EEMD method reducing the noise of the mixing fringe has the advantage on the high frequency as spherical aberration.

Original languageEnglish
Title of host publication2012 IEEE I2MTC - International Instrumentation and Measurement Technology Conference, Proceedings
Pages249-253
Number of pages5
DOIs
Publication statusPublished - 2012 Jul 30
Event2012 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2012 - Graz, Austria
Duration: 2012 May 132012 May 16

Other

Other2012 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2012
CountryAustria
CityGraz
Period12/5/1312/5/16

Keywords

  • ensemble empirical mode decomposition
  • optical testing
  • static fringe analysis

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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  • Cite this

    Chen, Y. T., Ou-Yang, M., Wu, S-D., Lin, S. G., Kuo, Y. T., & Lee, C. C. (2012). Using ensemble empirical mode decomposition to improve the static fringe analysis in optical testing. In 2012 IEEE I2MTC - International Instrumentation and Measurement Technology Conference, Proceedings (pp. 249-253). [6229233] https://doi.org/10.1109/I2MTC.2012.6229233