Abstract
The device core of a conventional quantum cascade laser (QCL) is composed of a superlattice of quantum wells (QWs) and barriers of fixed alloy compositions, which, for 4.5-5.0 μm-emitting QCLs operated at room temperature (RT), results in severe carrier leakage. In turn, the characteristic-temperature values for the threshold-current density J th and the slope efficiency are low: T0 is in the 130-150 K range 1-3 and T1 is in the 140-170 K range. 1,3 That is why the maximum wallplug efficiency η wp, max in CW operation at RT, for light emitted from the front facet of conventional devices with high-reflectivity-coated back facets, has typical values4 of only ≈13%, and no statistically relevant lifetest data have been reported to date for high-power CW devices. Furthermore, thermally accelerated lifetime studies3 have been limited to low CW powers (≤0.2 W); thus, no device-aging model can be deduced for high-CW-power (≥0.5 W) QCLs.
Original language | English |
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Article number | 6348312 |
Pages (from-to) | 30-31 |
Number of pages | 2 |
Journal | Conference Digest - IEEE International Semiconductor Laser Conference |
DOIs | |
Publication status | Published - 2012 |
Externally published | Yes |
Event | 23rd IEEE International Semiconductor Laser Conference, ISLC 2012 - San Diego, CA, United States Duration: 2012 Oct 7 → 2012 Oct 10 |
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics
- Electrical and Electronic Engineering