Time-resolved inline digital holography for measurement of optical nonlinear properties of quantum dots on substrates

Andrey V. Belashov, C. J. Cheng, Nikolay V. Petrov

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This work further develops a recently proposed time-resolved inline digital holography (TRIDH) [Petrov, N. V. et al. Opt. Lett. 43, 3481 (2018)] for studying degenerate phase modulation induced by an inclined collimated pump beam in the glass substrate with the quantum dots at the surface. Similar to many techniques for measuring nonlinear properties of materials, it is based on a comparison of the prediction obtained by the mathematical model of the phenomenon with experimental data. We have extended the mathematical model for the case of interaction of two femtosecond laser pulses in the double-layered sample. The impact of the ratio between nonlinear refractive indexes of two layers and their thicknesses on induced phase modulation is analyzed.

Original languageEnglish
Title of host publicationUltrafast Phenomena and Nanophotonics XXIV
EditorsMarkus Betz, Abdulhakem Y. Elezzabi
PublisherSPIE
ISBN (Electronic)9781510633193
DOIs
Publication statusPublished - 2020
Externally publishedYes
EventUltrafast Phenomena and Nanophotonics XXIV 2020 - San Francisco, United States
Duration: 2020 Feb 22020 Feb 4

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume11278
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceUltrafast Phenomena and Nanophotonics XXIV 2020
CountryUnited States
CitySan Francisco
Period20/2/220/2/4

Keywords

  • Digital holography
  • Femtosecond pulses
  • Nonlinear optical properties
  • Phase modulation
  • Pump-probe
  • Quantum dots
  • Time-resolved digital holography
  • Ultrafast phenomena

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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