Threading dislocation induced low frequency noise in strained-Si nMOSFETs

W. C. Hua, Min-Hung Lee, P. S. Chen, M. J. Tsai, Chee W. Liu

    Research output: Contribution to journalArticle

    31 Citations (Scopus)

    Abstract

    The correlations between the threading dislocations and the low-frequency noise characteristics of the n-type strained-Si field-effect transistors are studied using the devices with different sizes. The device-area-dependent SVG (power spectral density of the gate referred voltage noise) ratio of the strained-Si devices over the control Si devices obtained form geometric average can be understood by the modified carrier number fluctuation model with excess traps from the Poisson distributed threading dislocations. The equivalent trap number per threading dislocation extracted from the area-dependent SVG ratios is ∼85 for the strained-Si devices, and which results in ∼4.2X degradation of the SVG for the strained-Si device with the device area of 625 μm2.

    Original languageEnglish
    Pages (from-to)667-669
    Number of pages3
    JournalIEEE Electron Device Letters
    Volume26
    Issue number9
    DOIs
    Publication statusPublished - 2005 Sep 1

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    Power spectral density
    Field effect transistors
    Degradation
    Electric potential

    Keywords

    • Flicker noise
    • MOSFET
    • Strained-Si
    • Threading dislocation

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Electrical and Electronic Engineering

    Cite this

    Threading dislocation induced low frequency noise in strained-Si nMOSFETs. / Hua, W. C.; Lee, Min-Hung; Chen, P. S.; Tsai, M. J.; Liu, Chee W.

    In: IEEE Electron Device Letters, Vol. 26, No. 9, 01.09.2005, p. 667-669.

    Research output: Contribution to journalArticle

    Hua, W. C. ; Lee, Min-Hung ; Chen, P. S. ; Tsai, M. J. ; Liu, Chee W. / Threading dislocation induced low frequency noise in strained-Si nMOSFETs. In: IEEE Electron Device Letters. 2005 ; Vol. 26, No. 9. pp. 667-669.
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    AU - Lee, Min-Hung

    AU - Chen, P. S.

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    AU - Liu, Chee W.

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