Abstract
Thermal wave imaging of defects in opaque solids is carried out by focusing the periodically modulated intensity of a heat source (conventionally a laser, electron beam, or ion beam) at the surface of the solid. Solution of the heat equation shows that the ac temperature in the solid is wave-like (thermal waves), and critically damped. These waves can be used to probe the thermal properties of the subsurface of the solid, and their reflections from discontinuities in thermal impedance can be used to image subsurface defects such as inclusions, voids, cracks, and delaminations. Various techniques have been developed to detect the resulting ac temperature variations at the sample surface, including photoacoustic (gas-cell) detection, thermoacoustic (piezoelectric transducer) detection, optical probe beams, and ac infrared detection. Thermal wave imaging is particularly useful to probe subsurfaces from depths of about 1 micron to 300 microns, with a maximum depth of about 2 mm.
| Original language | English |
|---|---|
| Title of host publication | Sagamore Army Materials Research Conference Proceedings |
| Editors | James W. McCauley, Volker Weiss |
| Publisher | Plenum Press |
| Pages | 547-564 |
| Number of pages | 18 |
| ISBN (Print) | 0306420953 |
| Publication status | Published - 1986 Dec 1 |
Publication series
| Name | Sagamore Army Materials Research Conference Proceedings |
|---|---|
| ISSN (Print) | 0080-5335 |
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ASJC Scopus subject areas
- Engineering(all)
Cite this
THERMAL WAVE IMAGING OF DEFECTS IN OPAQUE SOLIDS. / Rose, D. N.; Bryk, D. C.; Thomas, D. J.; Thomas, R. L.; Favro, L. D.; Kuo, P. K.; Ingelhart, L. J.; Lin, M. J.; Legg, K. O.
Sagamore Army Materials Research Conference Proceedings. ed. / James W. McCauley; Volker Weiss. Plenum Press, 1986. p. 547-564 (Sagamore Army Materials Research Conference Proceedings).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
}
TY - GEN
T1 - THERMAL WAVE IMAGING OF DEFECTS IN OPAQUE SOLIDS.
AU - Rose, D. N.
AU - Bryk, D. C.
AU - Thomas, D. J.
AU - Thomas, R. L.
AU - Favro, L. D.
AU - Kuo, P. K.
AU - Ingelhart, L. J.
AU - Lin, M. J.
AU - Legg, K. O.
PY - 1986/12/1
Y1 - 1986/12/1
N2 - Thermal wave imaging of defects in opaque solids is carried out by focusing the periodically modulated intensity of a heat source (conventionally a laser, electron beam, or ion beam) at the surface of the solid. Solution of the heat equation shows that the ac temperature in the solid is wave-like (thermal waves), and critically damped. These waves can be used to probe the thermal properties of the subsurface of the solid, and their reflections from discontinuities in thermal impedance can be used to image subsurface defects such as inclusions, voids, cracks, and delaminations. Various techniques have been developed to detect the resulting ac temperature variations at the sample surface, including photoacoustic (gas-cell) detection, thermoacoustic (piezoelectric transducer) detection, optical probe beams, and ac infrared detection. Thermal wave imaging is particularly useful to probe subsurfaces from depths of about 1 micron to 300 microns, with a maximum depth of about 2 mm.
AB - Thermal wave imaging of defects in opaque solids is carried out by focusing the periodically modulated intensity of a heat source (conventionally a laser, electron beam, or ion beam) at the surface of the solid. Solution of the heat equation shows that the ac temperature in the solid is wave-like (thermal waves), and critically damped. These waves can be used to probe the thermal properties of the subsurface of the solid, and their reflections from discontinuities in thermal impedance can be used to image subsurface defects such as inclusions, voids, cracks, and delaminations. Various techniques have been developed to detect the resulting ac temperature variations at the sample surface, including photoacoustic (gas-cell) detection, thermoacoustic (piezoelectric transducer) detection, optical probe beams, and ac infrared detection. Thermal wave imaging is particularly useful to probe subsurfaces from depths of about 1 micron to 300 microns, with a maximum depth of about 2 mm.
UR - http://www.scopus.com/inward/record.url?scp=0022933488&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0022933488&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:0022933488
SN - 0306420953
T3 - Sagamore Army Materials Research Conference Proceedings
SP - 547
EP - 564
BT - Sagamore Army Materials Research Conference Proceedings
A2 - McCauley, James W.
A2 - Weiss, Volker
PB - Plenum Press
ER -