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The understanding of gate capacitance matching on achieving a high performance NC MOSFET with sufficient mobility

  • C. K. Chiang
  • , P. Husan
  • , Y. C. Lou
  • , F. L. Li
  • , E. R. Hsieh
  • , C. H. Liu
  • , Steve S. Chung

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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