The study of MCM-41 molecular sieves by energy-filtering TEM

K. J. Chao*, C. N. Wu, A. S. Chang, S. F. Hu

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

10 Citations (Scopus)


Energy-filtered transmission electron microscopy (EFTEM) was used to examine the distribution of silicon as T-atoms in mesoporous MCM-41 molecular sieves. At nanometer-sized resolution, the Si distribution image derived from electron energy loss spectroscopy (EELS) with Gatan imaging filter (GIF) was found to be ordered and correlated well to the hexagonal array of the one-dimensional channels of MCM-41. In addition, the pore-to-pore distance and the wall thickness of MCM-41 (determined by Si distribution map) are in good agreement with those derived from X-ray diffraction and N2 adsorption methods.

Original languageEnglish
Pages (from-to)287-295
Number of pages9
JournalMicroporous and Mesoporous Materials
Issue number2-3
Publication statusPublished - 1999 Feb
Externally publishedYes


  • MCM-41 molecular sieve
  • Si distribution image
  • Wall thickness

ASJC Scopus subject areas

  • General Chemistry
  • General Materials Science
  • Condensed Matter Physics
  • Mechanics of Materials


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