The study of MCM-41 molecular sieves by energy-filtering TEM

K. J. Chao; C. N. Wu; A. S. Chang; S. F. Hu

doi:10.1016/S1387-1811(98)00262-5

The study of MCM-41 molecular sieves by energy-filtering TEM

K. J. Chao^*, C. N. Wu, A. S. Chang, S. F. Hu

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

10 Citations (Scopus)

Abstract

Energy-filtered transmission electron microscopy (EFTEM) was used to examine the distribution of silicon as T-atoms in mesoporous MCM-41 molecular sieves. At nanometer-sized resolution, the Si distribution image derived from electron energy loss spectroscopy (EELS) with Gatan imaging filter (GIF) was found to be ordered and correlated well to the hexagonal array of the one-dimensional channels of MCM-41. In addition, the pore-to-pore distance and the wall thickness of MCM-41 (determined by Si distribution map) are in good agreement with those derived from X-ray diffraction and N₂ adsorption methods.

Original language	English
Pages (from-to)	287-295
Number of pages	9
Journal	Microporous and Mesoporous Materials
Volume	27
Issue number	2-3
DOIs	https://doi.org/10.1016/S1387-1811(98)00262-5
Publication status	Published - 1999 Feb
Externally published	Yes

Keywords

EFTEM
MCM-41 molecular sieve
Si distribution image
Wall thickness

ASJC Scopus subject areas

General Chemistry
General Materials Science
Condensed Matter Physics
Mechanics of Materials

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10.1016/S1387-1811(98)00262-5

Cite this

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title = "The study of MCM-41 molecular sieves by energy-filtering TEM",

abstract = "Energy-filtered transmission electron microscopy (EFTEM) was used to examine the distribution of silicon as T-atoms in mesoporous MCM-41 molecular sieves. At nanometer-sized resolution, the Si distribution image derived from electron energy loss spectroscopy (EELS) with Gatan imaging filter (GIF) was found to be ordered and correlated well to the hexagonal array of the one-dimensional channels of MCM-41. In addition, the pore-to-pore distance and the wall thickness of MCM-41 (determined by Si distribution map) are in good agreement with those derived from X-ray diffraction and N2 adsorption methods.",

keywords = "EFTEM, MCM-41 molecular sieve, Si distribution image, Wall thickness",

author = "Chao, {K. J.} and Wu, {C. N.} and Chang, {A. S.} and Hu, {S. F.}",

note = "Funding Information: The authors are grateful to Miss Hui-Tzu Chiu and Prof. Fu-Rong Chen of the Materials Science Center of Tsinghua University for operating the TEM and helpful discussions. This work was supported in part by the National Science Council of the Republic of China. ",

year = "1999",

month = feb,

doi = "10.1016/S1387-1811(98)00262-5",

language = "English",

volume = "27",

pages = "287--295",

journal = "Microporous and Mesoporous Materials",

issn = "1387-1811",

publisher = "Elsevier",

number = "2-3",

}

TY - JOUR

T1 - The study of MCM-41 molecular sieves by energy-filtering TEM

AU - Chao, K. J.

AU - Wu, C. N.

AU - Chang, A. S.

AU - Hu, S. F.

N1 - Funding Information: The authors are grateful to Miss Hui-Tzu Chiu and Prof. Fu-Rong Chen of the Materials Science Center of Tsinghua University for operating the TEM and helpful discussions. This work was supported in part by the National Science Council of the Republic of China.

PY - 1999/2

Y1 - 1999/2

N2 - Energy-filtered transmission electron microscopy (EFTEM) was used to examine the distribution of silicon as T-atoms in mesoporous MCM-41 molecular sieves. At nanometer-sized resolution, the Si distribution image derived from electron energy loss spectroscopy (EELS) with Gatan imaging filter (GIF) was found to be ordered and correlated well to the hexagonal array of the one-dimensional channels of MCM-41. In addition, the pore-to-pore distance and the wall thickness of MCM-41 (determined by Si distribution map) are in good agreement with those derived from X-ray diffraction and N2 adsorption methods.

AB - Energy-filtered transmission electron microscopy (EFTEM) was used to examine the distribution of silicon as T-atoms in mesoporous MCM-41 molecular sieves. At nanometer-sized resolution, the Si distribution image derived from electron energy loss spectroscopy (EELS) with Gatan imaging filter (GIF) was found to be ordered and correlated well to the hexagonal array of the one-dimensional channels of MCM-41. In addition, the pore-to-pore distance and the wall thickness of MCM-41 (determined by Si distribution map) are in good agreement with those derived from X-ray diffraction and N2 adsorption methods.

KW - EFTEM

KW - MCM-41 molecular sieve

KW - Si distribution image

KW - Wall thickness

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DO - 10.1016/S1387-1811(98)00262-5

M3 - Article

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SN - 1387-1811

VL - 27

SP - 287

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JO - Microporous and Mesoporous Materials

JF - Microporous and Mesoporous Materials

IS - 2-3

ER -

The study of MCM-41 molecular sieves by energy-filtering TEM

Abstract

Keywords

ASJC Scopus subject areas

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